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Fundamental Aspects of Ultrathin Dielectrics on Si-based Devices (Paperback, Softcover reprint of the original 1st ed. 1998):... Fundamental Aspects of Ultrathin Dielectrics on Si-based Devices (Paperback, Softcover reprint of the original 1st ed. 1998)
Eric Garfunkel, Evgeni Gusev, Alexander Vul
R4,726 Discovery Miles 47 260 Ships in 10 - 15 working days

An extrapolation of ULSI scaling trends indicates that minimum feature sizes below 0.1 mu and gate thicknesses of <3 nm will be required in the near future. Given the importance of ultrathin gate dielectrics, well-focused basic scientific research and aggressive development programs must continue on the silicon oxide, oxynitride, and high K materials on silicon systems, especially in the critical, ultrathin 1-3 nm regime. The main thrust of the present book is a review, at the nano and atomic scale, the complex scientific issues related to the use of ultrathin dielectrics in next-generation Si-based devices. The contributing authors are leading scientists, drawn from academic, industrial and government laboratories throughout the world, and representing such backgrounds as basic and applied physics, chemistry, electrical engineering, surface science, and materials science. Audience: Both expert scientists and engineers who wish to keep up with cutting edge research, and new students who wish to learn more about the exciting basic research issues relevant to next-generation device technology.

Fundamental Aspects of Ultrathin Dielectrics on Si-based Devices (Hardcover, 1998 ed.): Eric Garfunkel, Evgeni Gusev, Alexander... Fundamental Aspects of Ultrathin Dielectrics on Si-based Devices (Hardcover, 1998 ed.)
Eric Garfunkel, Evgeni Gusev, Alexander Vul
R4,593 Discovery Miles 45 930 Ships in 10 - 15 working days

An extrapolation of ULSI scaling trends indicates that minimum feature sizes below 0.1 mu and gate thicknesses of <3 nm will be required in the near future. Given the importance of ultrathin gate dielectrics, well-focused basic scientific research and aggressive development programs must continue on the silicon oxide, oxynitride, and high K materials on silicon systems, especially in the critical, ultrathin 1-3 nm regime. The main thrust of the present book is a review, at the nano and atomic scale, the complex scientific issues related to the use of ultrathin dielectrics in next-generation Si-based devices. The contributing authors are leading scientists, drawn from academic, industrial and government laboratories throughout the world, and representing such backgrounds as basic and applied physics, chemistry, electrical engineering, surface science, and materials science. Audience: Both expert scientists and engineers who wish to keep up with cutting edge research, and new students who wish to learn more about the exciting basic research issues relevant to next-generation device technology.

Detonation Nanodiamonds - Science and Applications (Hardcover): Alexander Vul, Olga Shenderova Detonation Nanodiamonds - Science and Applications (Hardcover)
Alexander Vul, Olga Shenderova
R3,548 Discovery Miles 35 480 Ships in 12 - 17 working days

A comprehensive overview of detonation nanodiamond particles produced by detonation of carbon-containing explosives, this book discusses the technology of synthesis and the effect of various technological parameters on the structure and physicochemical properties of nanodiamonds. It explores the possibilities of targeted chemical modification of the surface, describes methods of structural modification of nanodiamonds aimed at obtaining nanographite, analyzes the various methods employed in studies of nanodiamonds as a carbon nanostructure, and suggests and explores at length the potential of nanodiamond application in technology and medicine.

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