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The book is aimed at assessing the capabilities of state-of-the-art
optical techniques in elucidating the fundamental electronic and
structural properties of semiconductor and metal surfaces,
interfaces, thin layers, and layer structures, and assessing the
usefulness of these techniques for optimization of high quality
multilayer samples through feedback control during materials growth
and processing. Particular emphasis is dedicated to the theory of
nonlinear optics and to dynamical processes through the use of
pump-probe techniques together with the search for new optical
sources. Some new applications of Scanning Probe Microscopy to
Material Science and biological samples, dried and in vivo, with
the use of different laser sources are also presented. Materials of
particular interest are silicon, semiconductor-metal interfaces,
semiconductor and magnetic multi-layers and III-V compound
semiconductors.
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