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Filling a gap in the literature, Practical Engineering Failure
Analysis vividly demonstrates the correct methodology to conduct
successful failure analyses, as well as offering the background
necessary for these investigations. This authoritative reference
covers procedures to reduce the occurrence of component failures
due to errors in material selection, design, and manufacturing, as
well as fatigue, stress, cracking, creep, and operating conditions.
A single-source tool to help professionals avoid costly system
failures, improve plant operation and system reliability, and
prevent accidents related to component malfunction
This book was developed with the goal of providing an easily
understood text for those users of the scanning electron microscope
(SEM) who have little or no background in the area. The SEM is
routinely used to study the surface structure and chemistry of a
wide range of biological and synthetic materials at the micrometer
to nanometer scale. Ease-of-use, typically facile sample
preparation, and straightforward image interpretation, combined
with high resolution, high depth of field, and the ability to
undertake microchemical and crystallographic analysis, has made
scanning electron microscopy one of the most powerful and versatile
techniques for characterization today. Indeed, the SEM is a vital
tool for the characterization of nanostructured materials and the
development of nanotechnology. However, its wide use by
professionals with diverse technical backgrounds-including life
science, materials science, engineering, forensics, mineralogy,
etc., and in various sectors of government, industry, and
academia-emphasizes the need for an introductory text providing the
basics of effective SEM imaging.A Beginners' Guide to Scanning
Electron Microscopy explains instrumentation, operation, image
interpretation and sample preparation in a wide ranging yet
succinct and practical text, treating the essential theory of
specimen-beam interaction and image formation in a manner that can
be effortlessly comprehended by the novice SEM user. This book
provides a concise and accessible introduction to the essentials of
SEM includes a large number of illustrations specifically chosen to
aid readers' understanding of key concepts highlights recent
advances in instrumentation, imaging and sample preparation
techniques offers examples drawn from a variety of applications
that appeal to professionals from diverse backgrounds.
This book was developed with the goal of providing an easily
understood text for those users of the scanning electron microscope
(SEM) who have little or no background in the area. The SEM is
routinely used to study the surface structure and chemistry of a
wide range of biological and synthetic materials at the micrometer
to nanometer scale. Ease-of-use, typically facile sample
preparation, and straightforward image interpretation, combined
with high resolution, high depth of field, and the ability to
undertake microchemical and crystallographic analysis, has made
scanning electron microscopy one of the most powerful and versatile
techniques for characterization today. Indeed, the SEM is a vital
tool for the characterization of nanostructured materials and the
development of nanotechnology. However, its wide use by
professionals with diverse technical backgrounds-including life
science, materials science, engineering, forensics, mineralogy,
etc., and in various sectors of government, industry, and
academia-emphasizes the need for an introductory text providing the
basics of effective SEM imaging.A Beginners' Guide to Scanning
Electron Microscopy explains instrumentation, operation, image
interpretation and sample preparation in a wide ranging yet
succinct and practical text, treating the essential theory of
specimen-beam interaction and image formation in a manner that can
be effortlessly comprehended by the novice SEM user. This book
provides a concise and accessible introduction to the essentials of
SEM includes a large number of illustrations specifically chosen to
aid readers' understanding of key concepts highlights recent
advances in instrumentation, imaging and sample preparation
techniques offers examples drawn from a variety of applications
that appeal to professionals from diverse backgrounds.
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