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Essential Spectrum-based Fault Localization (Paperback, 1st ed. 2021): Xiaoyuan Xie, Baowen Xu Essential Spectrum-based Fault Localization (Paperback, 1st ed. 2021)
Xiaoyuan Xie, Baowen Xu
R2,923 Discovery Miles 29 230 Ships in 10 - 15 working days

Program debugging has always been a difficult and time-consuming task in the context of software development, where spectrum-based fault localization (SBFL) is one of the most widely studied families of techniques. While it's not particularly difficult to learn about the process and empirical performance of a particular SBFL technique from the available literature, researchers and practitioners aren't always familiar with the underlying theories. This book provides the first comprehensive guide to fundamental theories in SBFL, while also addressing some emerging challenges in this area. The theoretical framework introduced here reveals the intrinsic relations between various risk evaluation formulas, making it possible to construct a formula performance hierarchy. Further extensions of the framework provide a sufficient and necessary condition for a general maximal formula, as well as performance comparisons for hybrid SBFL methods. With regard to emerging challenges in SBFL, the book mainly covers the frequently encountered oracle problem in SBFL and introduces a metamorphic slice-based solution. In addition, it discusses the challenge of multiple-fault localization and presents cutting-edge approaches to overcoming it. SBFL is a widely studied research area with a massive amount of publications. Thus, it is essential that the software engineering community, especially those involved in program debugging, software maintenance and software quality assurance (including both newcomers and researchers who want to gain deeper insights) understand the most fundamental theories - which could also be very helpful to ensuring the healthy development of the field.

Essential Spectrum-based Fault Localization (Hardcover, 1st ed. 2021): Xiaoyuan Xie, Baowen Xu Essential Spectrum-based Fault Localization (Hardcover, 1st ed. 2021)
Xiaoyuan Xie, Baowen Xu
R2,957 Discovery Miles 29 570 Ships in 10 - 15 working days

Program debugging has always been a difficult and time-consuming task in the context of software development, where spectrum-based fault localization (SBFL) is one of the most widely studied families of techniques. While it's not particularly difficult to learn about the process and empirical performance of a particular SBFL technique from the available literature, researchers and practitioners aren't always familiar with the underlying theories. This book provides the first comprehensive guide to fundamental theories in SBFL, while also addressing some emerging challenges in this area. The theoretical framework introduced here reveals the intrinsic relations between various risk evaluation formulas, making it possible to construct a formula performance hierarchy. Further extensions of the framework provide a sufficient and necessary condition for a general maximal formula, as well as performance comparisons for hybrid SBFL methods. With regard to emerging challenges in SBFL, the book mainly covers the frequently encountered oracle problem in SBFL and introduces a metamorphic slice-based solution. In addition, it discusses the challenge of multiple-fault localization and presents cutting-edge approaches to overcoming it. SBFL is a widely studied research area with a massive amount of publications. Thus, it is essential that the software engineering community, especially those involved in program debugging, software maintenance and software quality assurance (including both newcomers and researchers who want to gain deeper insights) understand the most fundamental theories - which could also be very helpful to ensuring the healthy development of the field.

Intelligent Software Defect Prediction (1st ed. 2023): Xiaoyuan Jing, Haowen Chen, Baowen Xu Intelligent Software Defect Prediction (1st ed. 2023)
Xiaoyuan Jing, Haowen Chen, Baowen Xu
R4,750 Discovery Miles 47 500 Ships in 10 - 15 working days

With the increasing complexity of and dependency on software, software products may suffer from low quality, high prices, be hard to maintain, etc. Software defects usually produce incorrect or unexpected results and behaviors. Accordingly, software defect prediction (SDP) is one of the most active research fields in software engineering and plays an important role in software quality assurance. Based on the results of SDP analyses, developers can subsequently conduct defect localization and repair on the basis of reasonable resource allocation, which helps to reduce their maintenance costs. This book offers a comprehensive picture of the current state of SDP research. More specifically, it introduces a range of machine-learning-based SDP approaches proposed for different scenarios (i.e., WPDP, CPDP, and HDP). In addition, the book shares in-depth insights into current SDP approaches’ performance and lessons learned for future SDP research efforts. We believe these theoretical analyses and emerging challenges will be of considerable interest to all researchers, graduate students, and practitioners who want to gain deeper insights into and/or find new research directions in SDP. It offers a comprehensive introduction to the current state of SDP and detailed descriptions of representative SDP approaches.

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