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The field of large-scale dimensional metrology (LSM) deals with
objects that have linear dimensions ranging from tens to hundreds
of meters. It has recently attracted a great deal of interest in
many areas of production, including the automotive, railway, and
shipbuilding sectors. Distributed Large-Scale Dimensional Metrology
introduces a new paradigm in this field that reverses the classical
metrological approach: measuring systems that are portable and can
be easily moved around the location of the measured object, which
is preferable to moving the object itself. Distributed Large-Scale
Dimensional Metrology combines the concepts of distributed systems
and large scale metrology at the application level. It focuses on
the latest insights and challenges of this new generation of
systems from the perspective of the designers and developers. The
main topics are: coverage of measuring area, sensors calibration,
on-line diagnostics, probe management, and analysis of metrological
performance. The general descriptions of each topic are further
enriched by specific examples concerning the use of commercially
available systems or the development of new prototypes. This will
be particularly useful for professional practitioners such as
quality engineers, manufacturing and development engineers, and
procurement specialists, but Distributed Large-Scale Dimensional
Metrology also has a wealth of information for interested
academics.
The field of large-scale dimensional metrology (LSM) deals with
objects that have linear dimensions ranging from tens to hundreds
of meters. It has recently attracted a great deal of interest in
many areas of production, including the automotive, railway, and
shipbuilding sectors. Distributed Large-Scale Dimensional Metrology
introduces a new paradigm in this field that reverses the classical
metrological approach: measuring systems that are portable and can
be easily moved around the location of the measured object, which
is preferable to moving the object itself. Distributed Large-Scale
Dimensional Metrology combines the concepts of distributed systems
and large scale metrology at the application level. It focuses on
the latest insights and challenges of this new generation of
systems from the perspective of the designers and developers. The
main topics are: coverage of measuring area, sensors calibration,
on-line diagnostics, probe management, and analysis of metrological
performance. The general descriptions of each topic are further
enriched by specific examples concerning the use of commercially
available systems or the development of new prototypes. This will
be particularly useful for professional practitioners such as
quality engineers, manufacturing and development engineers, and
procurement specialists, but Distributed Large-Scale Dimensional
Metrology also has a wealth of information for interested
academics.
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