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This book has its origins in the intensive short courses on
scanning elec tron microscopy and x-ray microanalysis which have
been taught annually at Lehigh University since 1972. In order to
provide a textbook containing the materials presented in the
original course, the lecturers collaborated to write the book
Practical Scanning Electron Microscopy (PSEM), which was published
by Plenum Press in 1975. The course con tinued to evolve and expand
in the ensuing years, until the volume of material to be covered
necessitated the development of separate intro ductory and advanced
courses. In 1981 the lecturers undertook the project of rewriting
the original textbook, producing the volume Scan ning Electron
Microscopy and X-Ray Microanalysis (SEMXM). This vol ume contained
substantial expansions of the treatment of such basic material as
electron optics, image formation, energy-dispersive x-ray
spectrometry, and qualitative and quantitative analysis. At the
same time, a number of chapters, which had been included in the
PSEM vol ume, including those on magnetic contrast and electron
channeling con trast, had to be dropped for reasons of space.
Moreover, these topics had naturally evolved into the basis of the
advanced course. In addition, the evolution of the SEM and
microanalysis fields had resulted in the devel opment of new
topics, such as digital image processing, which by their nature
became topics in the advanced course.
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