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The extraordinary life of Cher can be told by only one person … Cher
herself.
After more than seventy years of fighting to live her life on her own
terms, Cher finally reveals her true story in intimate detail, in a
two-part memoir.
Her remarkable career is unique and unparalleled. The only woman to top
Billboard charts in seven consecutive decades, she is the winner of an
Academy Award, an Emmy, a Grammy and a Cannes Film Festival Award, and
an inductee to the Rock and Roll Hall of Fame who has been lauded by
the Kennedy Center.
She is a longtime activist and philanthropist.
As a dyslexic child who dreamed of becoming famous, Cher was raised in
often-chaotic circumstances, surrounded by singers, actors and a mother
who inspired her in spite of their difficult relationship.
With her trademark honesty and humour, Cher: The Memoir traces how this
diamond in the rough succeeded with no plan and little confidence to
become the trailblazing superstar the world has been unable to ignore
for more than half a century.
Cher: The Memoir, Part One follows her extraordinary beginnings through
childhood to meeting and marrying Sonny Bono – and reveals the highly
complicated relationship that made them world-famous, but eventually
drove them apart.
Cher: The Memoir reveals the daughter, the sister, the wife, the lover,
the mother and the superstar.
It is a life too immense for only one book.
Reliability and Failure Analysis of High-Power LED Packaging
provides fundamental understanding of the reliability and failure
analysis of materials for high-power LED packaging, with the
ultimate goal of enabling new packaging materials. This book
describes the limitations of the present reliability standards in
determining the lifetime of high-power LEDs due to the lack of deep
understanding of the packaging materials and their interaction with
each other. Many new failure mechanisms are investigated and
presented with consideration of the different stresses imposed by
varying environmental conditions. The detailed failure mechanisms
are unique to this book and will provide insights for readers
regarding the possible failure mechanisms in high-power LEDs. The
authors also show the importance of simulation in understanding the
hidden failure mechanisms in LEDs. Along with simulation, the use
of various destructive and non-destructive tools such as C-SAM,
SEM, FTIR, Optical Microscopy, etc. in investigation of the causes
of LED failures are reviewed. The advancement of LEDs in the last
two decades has opened vast new applications for LEDs which also
has led to harsher stress conditions for high-power LEDs. Thus,
existing standards and reliability tests need to be revised to meet
the new demands for high-power LEDs.
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