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Scanning near-field optical microscopy (SNOM, also known as NSOM)
is a new local probe technique with a resolving power of 10--50 nm.
Not being limited by diffraction, near-field optics (NFO) opens new
perspectives for optical characterization and the understanding of
optical phenomena, in particular in biology, microelectronics and
materials science. SNOM, after first demonstrations in '83/'84, has
undergone a rapid development in the past two to four years. The
increased interest has been largely stimulated by the wealth of
optical properties that can be investigated and the growing
importance of characterization on the nanometer scale in general.
Examples include the use of fluorescence, birefrigence and plasmon
effects for applications in particular in biology, microelectronics
and materials science, to name just a few. This volume emerged from
the first international meeting devoted exclusively to NFO, and
comprises a complete survey of the 1992 activities in the field, in
particular the variety of instrumental techniques that are
currently being explored, the demonstration of the imaging
capabilities as well as theoretical interpretations - a highly
nontrivial task. The comprehensive collection of papers devoted to
these and related subjects make the book a valuable tool for
anybody interested in near-field optics.
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