Polymer Surface Characterization provides a comprehensive approach to the surface analysis of polymers of technological interest by means of modern analytical techniques. Basic principles, operative conditions, applications, performance, and limiting features are supplied, together with current advances in instrumental apparatus. Each chapter is devoted to one technique and is self-consistent; the end-of-chapter references would allow the reader a quick access to more detailed information. After an introductory chapter, techniques that can interrogate the very shallow depth of a polymer surface, spanning from the top few angstroms in secondary ions mass spectrometry to 2-10 nm in X-ray photoelectron spectroscopy are discussed, followed by Fourier transform infrared spectroscopy and chapters on characterization by scanning probe microscopy, electron microscopies, wettability and spectroscopic ellipsometry.

This fully updated edition provides a broad approach to the surface analysis of polymers being of high technological interest. Modern analytical techniques, potential applications and recent advances in instrumental apparatus are discussed. The self-consistent chapters are devoted to spectroscopic and microscopic techniques which represent powerful tools for the characterization of morphology and chemical, physical, mechanical properties of polymer surfaces, interfaces, and thin fi lms. Selection of techniques which can properly address very shallow depth of surfaces, spanning from few angstroms to tens of nanometers Interaction of polymer surfaces with their surroundings is pointed out as a critical issue for specifi c applications