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This volume contains the proceedin,r. of the NATO Advanced Study
Institute on "Forces in Scanning Probe Methods which was
CG-sponsered and organized by the "Forum fUr N anowissenschaften".
The conference was held in Schluchsee in the south- em Black Forest
(Germany) from March 7-18, 1994. 30 invited lecturers giving tuto-
rial talks of historical and recent research activities and about
100 contributed, oral and poster presentations from 130 people
participating, created a very active and lestimulating, lively
atmosphere. The inventions of scanning tunneling microscopy, atomic
force microscopy and near field optical microsocopy opened a new
field of research, called scanning probe meth- ods (SPM). During
the last decade, the quality of image acquisition made tremendous
progress due to advanced data acquisition systems, low noise
electronics and suitable mechan- ical and micromechanical
constructions. However, a lot of fundamental, unsolved questions
about the interaction between probing tip and sample remain. This
vol- ume contains 60 contributions dedicated to these problems.
Most of the articles are review articles presenting. condensed and
relevant information in a way suitable for both students and
specialists. Topics that are covered are instrumental aspects, de-
signs of force microscopes in various environments, such as ambient
pressure, low temperature, ultrahip vacuum and liquids. An
important part of the workshop was dedicated to theory, Including
all initio calculations and molecular dynamics simula- tions.
Mechanical properties, such as adhesion, friction and wear, on the
micrometer and nanometer scale were also treated intensively.
Scanning Tunneling Microscopy II, like its predecessor, presents
detailed and comprehensive accounts of the basic principles and the
broad range of applications of STM and related scanning probe
techniques. The applications discussed in this volume come
predominantly from the fields of electrochemistry and biology. In
contrast to those in STM I, these studies may be performed in air
and in liquids. The extensions of the basic technique to map other
interactions are described in chapters on scanning force
microscopy, magnetic force microscopy, and scanning near-field
optical microscopy, together with a survey of other related
techniques. Also discussed here is the use of a scanning proximal
probe for surface modification. Together, the two volumes give a
comprehensive account of experimental aspects of STM and provide
essential reading and reference material. In this second edition
the text has been updated and new methods are discussed.
This volume contains the proceedin,r. of the NATO Advanced Study
Institute on "Forces in Scanning Probe Methods which was
CG-sponsered and organized by the "Forum fUr N anowissenschaften".
The conference was held in Schluchsee in the south- em Black Forest
(Germany) from March 7-18, 1994. 30 invited lecturers giving tuto-
rial talks of historical and recent research activities and about
100 contributed, oral and poster presentations from 130 people
participating, created a very active and lestimulating, lively
atmosphere. The inventions of scanning tunneling microscopy, atomic
force microscopy and near field optical microsocopy opened a new
field of research, called scanning probe meth- ods (SPM). During
the last decade, the quality of image acquisition made tremendous
progress due to advanced data acquisition systems, low noise
electronics and suitable mechan- ical and micromechanical
constructions. However, a lot of fundamental, unsolved questions
about the interaction between probing tip and sample remain. This
vol- ume contains 60 contributions dedicated to these problems.
Most of the articles are review articles presenting. condensed and
relevant information in a way suitable for both students and
specialists. Topics that are covered are instrumental aspects, de-
signs of force microscopes in various environments, such as ambient
pressure, low temperature, ultrahip vacuum and liquids. An
important part of the workshop was dedicated to theory, Including
all initio calculations and molecular dynamics simula- tions.
Mechanical properties, such as adhesion, friction and wear, on the
micrometer and nanometer scale were also treated intensively.
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