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This book provides the readers with the full basic knowledge
necessary to understand, evaluate and develop critically any ETAAS
analysis. The book covers comprehensively all aspects of the
theoretical principles, routine and unusual instrumentation,
overlapping possibilities with other techniques and different
analytical characteristics of ETAAS at an averaged
intermediate/high level. This is a good topic for a text book owing
to the wide analytical possibilities of ETAAS in academic and
industry laboratories. The book is written by a qualified expert
with 30 years' experience working on different aspects of ETAAS.The
work guides the readers through an in-depth descriptive appraisal
of the chemical and physical processes occurring in an ET atomiser.
The work compares favourably with other books already published on
this subject as this work shows an overview with some different
perspectives, focusing mainly on the processes taking place during
an ETAAS analysis. An ordered, rigorous and deep description is
found in every chapter. The book would be adequate for
undergraduate and graduate students in any course of analytical
chemistry, researchers in analytical atomic spectrometry and
analysts who routinely use ETAAS. Amateurs and specialists in this
field will find a good support in the book.
Este trabajo se centro en el comportamiento de varias especies de
interferentes y modificadores quimicos en fase solida en una
plataforma de grafito. Tambien se estudio el comportamiento de los
principales componentes de la matriz (aluminio y silicio) solos y
junto con los modificadores y el analito (As). Asi, en la primera
parte de este trabajo se estudio el comportamiento de diferentes
interferentes, sulfatos y cloruros de metales alcalinos (sodio,
potasio) y alcalinoterreos (calcio, magnesio y berilio), asi como,
cloruro y nitrato de aluminio. Los mecanismos de descomposicion de
dichas sales se elucidaron en fase condensada a diversas
temperaturas. Como modificadores quimicos se estudiaron sales de
torio y circonio, mientras que como principales componentes de la
matriz se utilizaron los oxidos de silicio y aluminio. La
localizacion del residuo solido fue posible utilizando la
microscopia electronica de barrido (SEM), mientras que la
identificacion de los elementos se llevo a cabo mediante
espectrometria de rayos X empleando un detector de energias
dispersivas. De manera similar, los compuestos solidos se
identificaron por microanalisis Raman y espectrometria FT-IR.
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