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Computational Surface and Roundness Metrology (Hardcover, 2009 ed.): Balasubramanian Muralikrishnan, Jayaraman Raja Computational Surface and Roundness Metrology (Hardcover, 2009 ed.)
Balasubramanian Muralikrishnan, Jayaraman Raja
R4,469 Discovery Miles 44 690 Ships in 10 - 15 working days

Computational Surface and Roundness Metrology provides an extraordinarily practical and hands-on approach towards understanding the diverse array of mathematical methods used in surface texture and roundness analysis. The book, in combination with a mathematical package or programming language interface, provides an invaluable tool for experimenting, learning, and discovering the many flavors of mathematics that are so routinely taken for granted in metrology. Whether the objective is to understand the origin of that ubiquitous transmission characteristics curve of a filter we see so often yet do not quite comprehend, or to delve into the intricate depths of a deceptively simple problem of fitting a line or a plane to a set of points, this book describes it all (in exhaustive detail). From the graduate student of metrology to the practicing engineer on the shop floor, this book is a must-have reference for all involved in metrology, instrumentation/optics, manufacturing, and electronics."

Computational Surface and Roundness Metrology (Paperback, Softcover reprint of hardcover 1st ed. 2009): Balasubramanian... Computational Surface and Roundness Metrology (Paperback, Softcover reprint of hardcover 1st ed. 2009)
Balasubramanian Muralikrishnan, Jayaraman Raja
R4,441 Discovery Miles 44 410 Ships in 10 - 15 working days

Computational Surface and Roundness Metrology provides an extraordinarily practical and hands-on approach towards understanding the diverse array of mathematical methods used in surface texture and roundness analysis. The book, in combination with a mathematical package or programming language interface, provides an invaluable tool for experimenting, learning, and discovering the many flavors of mathematics that are so routinely taken for granted in metrology. Whether the objective is to understand the origin of that ubiquitous transmission characteristics curve of a filter we see so often yet do not quite comprehend, or to delve into the intricate depths of a deceptively simple problem of fitting a line or a plane to a set of points, this book describes it all (in exhaustive detail). From the graduate student of metrology to the practicing engineer on the shop floor, this book is a must-have reference for all involved in metrology, instrumentation/optics, manufacturing, and electronics."

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