|
Showing 1 - 3 of
3 matches in All Departments
X-ray emission spectrography, while based on Moseley's work, as a
generally useful analytical method had its genesis in the work of
Friedman, Birks, and Brooks 30 years ago. The central theme of this
conference, quantitative methods in X-ray spectrometric analy sis,
and the large number of papers on that subject attest to the growth
of the application and usefulness of X-ray emission. It is a
privilege to have as an invited speaker Laverne Birks, one of the
original group that put X-ray emission into analytical chemistry.
Determination of elements above titanium in the periodic table was
considered the province of X-ray fluorescence, and most of the
early development was aimed at the analy sis of alloys. The papers
in this volume on metals analysis accept most operational features
as routine and have concentrated on the improved treatment of the
observed data in order to convert them to more accurate results. As
the treatment of matrix effects, geometry, and stability have been
better understood, corrections have become routine. For most
elements that are present in amounts greater than a few parts per
million, determinations can now be done with accuracies rivaling
wet methods. Trace quantities are being determined to lower and
lower amounts, largely owing to improvement of equipment and
development of concentration techniques. For most trace elements,
X-ray spectrography has become the preferred analytical method. The
develop ment of improved methods for separating signals from noise
should lead to major reduc tions in minimum detection levels.
The featured subject of the 1966 Denver X-Ray Conference was X-Ray
Diffraction Topography and Dynamical X-Ray Phenomena. One of the
chairmen of the featured ses sions, Professor R. A. Young, made the
following remarks at the conclusion of his session. We think they
are quite appropriate to the occasion and with his permission we
reproduce them here.
The University of Denver and its staff members deserve much credit
for organizing and operating this Denver X-ray Conference year
after year, for there seems to be no doubt that it and the yolumes
that result from it are filling a need. The interests covered by
the papers at one of these conferences vary from year to year and
as a whole cover a wide spread of topics. This is as it should be.
Old problems that have been with us for many years are being
attacked again with new and more effective tools, new problems are
continually arising, and new methods of great power are being
developed. These developments are occurring in each of the fields
covered, as may readily be seen by a glance at this twelfth volume
and other recent volumes of this series. It seems clear that the
policy of having these conferences and these volumes cover a wide
field rather than a single one such as, for example, structure
determination, or fluorescence analysis, is a policy that meets
with general approval and should be continued. I understand there
is every intention to do so. C. S. Barrett It is customary to
acknowledge in each volume the invited session chairmen of the
three-day meeting. They and the sessions at which they presided
(21-23 August 1968) were as follows: CRYSTALLOGRAPHY AND
DIFFRACTION. C. S. Barrett, University of Chicago, Chicago,
Illinois. METHODS AND THEIR APPLICATIONS. B. C. Giessen,
Massachusetts Institute of Technology, Cambridge, Massachusetts.
|
You may like...
The Expendables 2
Sylvester Stallone, Jason Statham, …
Blu-ray disc
(1)
R64
Discovery Miles 640
|