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The book is a history of Molecular Beam Epitaxy (MBE) as applied to
the growth of semiconductor thin films (note that it does not cover
the subject of metal thin films). It begins by examining the
origins of MBE, first of all looking at the nature of molecular
beams and considering their application to fundamental physics, to
the development of nuclear magnetic resonance and to the invention
of the microwave MASER. It shows how molecular beams of silane
(SiH4) were used to study the nucleation of silicon films on a
silicon substrate and how such studies were extended to compound
semiconductors such as GaAs. From such surface studies in
ultra-high vacuum the technique developed into a method of growing
high quality single crystal films of a wide range of
semiconductors. Comparing this with earlier evaporation methods of
deposition and with other epitaxial deposition methods such as
liquid phase and vapour phase epitaxy (LPE and VPE). The text
describes the development of MBE machines from the early
ahome-madea variety to that of commercial equipment and show how
MBE was gradually refined to produce high quality films with atomic
dimensions. This was much aided by the use of various in-situ
surface analysis techniques, such as reflection high energy
electron diffraction (RHEED) and mass spectrometry, a feature
unique to MBE. It looks at various modified versions of the basic
MBE process, then proceed to describe their application to the
growth of so-called alow-dimensional structuresa (LDS) based on
ultra-thin heterostructure films with thickness of order a few
molecular monolayers. Further chapters cover the growth of a wide
range of different compounds and describe their application to
fundamental physics and to the fabrication of electronic and
opto-electronic devices. The authors study the historical
development of all these aspects and emphasise both the (often
unexpected) manner of their discovery and development and the
unique features which MBE brings to the growth of extremely complex
structures with monolayer accuracy.
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