This book is a new edition of a classic text on experimental methods and instruments in surface science. It offers practical insight useful to chemists, physicists, and materials scientists working in experimental surface science. This enlarged second edition contains almost 300 descriptions of experimental methods. The more than 50 active areas with individual scientific and measurement concepts and activities relevant to each area are presented in this book. The key areas covered are: Vacuum System Technology, Mechanical Fabrication Techniques, Measurement Methods, Thermal Control, Delivery of Adsorbates to Surfaces, UHV Windows, Surface Preparation Methods, High Area Solids, Safety. The book is written for researchers and graduate students.

This book is a new edition of a classic text on experimental methods and instruments in surface science. It offers practical insight useful to chemists, physicists, and materials scientists working in experimental surface science. This enlarged second edition contains almost 300 descriptions of experimental methods. The more than 50 active areas with individual scientific and measurement concepts and activities relevant to each area are presented in this book. The key areas covered are: Vacuum System Technology, Mechanical Fabrication Techniques, Measurement Methods, Thermal Control, Delivery of Adsorbates to Surfaces, UHV Windows, Surface Preparation Methods, High Area Solids, Safety. The book is written for researchers and graduate students.

are intended to fill the gap between a manufacturer's handbook, and review articles that highlight the latest scientific developments. A fourth volume will deal with techniques for specimen handling, beam artifacts, and depth profiling. It will provide a compilation of methods that have proven useful for specimen handling and treatment, and it will also address the common artifacts and problems associated with the bombardment of solid sur faces by photons, electrons, and ions. A description will be given of methods for depth profiling. Surface characterization measurements are being used increasingly in di verse areas of science and technology. We hope that this series will be useful in ensuring that these measurements can be made as efficiently and reliably as possible. Comments on the series are welcomed, as are suggestions for volumes on additional topics. C. J. Powell Gaithersburg, Maryland A. W. Czandema Golden, Colorado D. M. Hercules Pittsburgh, Pennsylvania T. E. Madey New Brunswick, New Jersey J. T. Yates, Jr."

The observation of the vibrational spectra of adsorbed species provides one of the most incisive methods for und erst an ding chemical and physical phenomena on surfaces. At the present time, many approaches may be applied to studies of molecular vibrations on surfaces. Some of these are used on high-area solids of technological importance (e.g., heterogeneous catalysts) while others are applied to single-crystal substrates to gain better understanding under conditions of controlled surface structure. This book has attempted to bring together in one place a discussion of the major methods used to measure vibrational spectra of surface species. The emphasis is on basic concepts and experimental methods rather than a current survey of the extensive literature in this field. Two introductory chapters describe the basic theoretical aspects of vibrational spectroscopy on surfaces, dealing with normal modes and excitation mechanisms in vibrational spectroscopy. The remaining seven chapters deal with various methods employed to observe surface vibra tions. These are arranged in an order that first treats the use of various methods on surfaces that are not of the single-crystal type. It is in this area that the field first got started in the late 1940s with pioneering work by Terenin and others in the Soviet Union, and by Eisehens and others in the United States in the 1950s. The last four chapters deal with relatively recent methods that permit vibrational studies to be made on single crystal substrates."

are intended to fill the gap between a manufacturer's handbook, and review articles that highlight the latest scientific developments. A fourth volume will deal with techniques for specimen handling, beam artifacts, and depth profiling. It will provide a compilation of methods that have proven useful for specimen handling and treatment, and it will also address the common artifacts and problems associated with the bombardment of solid sur faces by photons, electrons, and ions. A description will be given of methods for depth profiling. Surface characterization measurements are being used increasingly in di verse areas of science and technology. We hope that this series will be useful in ensuring that these measurements can be made as efficiently and reliably as possible. Comments on the series are welcomed, as are suggestions for volumes on additional topics. C. J. Powell Gaithersburg, Maryland A. W. Czandema Golden, Colorado D. M. Hercules Pittsburgh, Pennsylvania T. E. Madey New Brunswick, New Jersey J. T. Yates, Jr."

The MRS Symposium Proceeding series is an internationally recognised reference suitable for researchers and practitioners.