Characterization enables a microscopic understanding of the fundamental properties of materials (Science) to predict their macroscopic behaviour (Engineering). With this focus, Principles of Materials Characterization and Metrology presents a comprehensive discussion of the principles of materials characterization and metrology. Characterization techniques are introduced through elementary concepts of bonding, electronic structure of molecules and solids, and the arrangement of atoms in crystals. Then, the range of electrons, photons, ions, neutrons and scanning probes, used in characterization, including their generation and related beam-solid interactions that determine or limit their use, is presented. This is followed by ion-scattering methods, optics, optical diffraction, microscopy, and ellipsometry. Generalization of Fraunhofer diffraction to scattering by a three-dimensional arrangement of atoms in crystals leads to X-ray, electron, and neutron diffraction methods, both from surfaces and the bulk. Discussion of transmission and analytical electron microscopy, including recent developments, is followed by chapters on scanning electron microscopy and scanning probe microscopies. The book concludes with elaborate tables to provide a convenient and easily accessible way of summarizing the key points, features, and inter-relatedness of the different spectroscopy, diffraction, and imaging techniques presented throughout. Principles of Materials Characterization and Metrology uniquely combines a discussion of the physical principles and practical application of these characterization techniques to explain and illustrate the fundamental properties of a wide range of materials in a tool-based approach. Based on forty years of teaching and research, this book incorporates worked examples, to test the reader's knowledge with extensive questions and exercises.

Characterization enables a microscopic understanding of the fundamental properties of materials (Science) to predict their macroscopic behaviour (Engineering). With this focus, Principles of Materials Characterization and Metrology presents a comprehensive discussion of the principles of materials characterization and metrology. Characterization techniques are introduced through elementary concepts of bonding, electronic structure of molecules and solids, and the arrangement of atoms in crystals. Then, the range of electrons, photons, ions, neutrons and scanning probes, used in characterization, including their generation and related beam-solid interactions that determine or limit their use, is presented. This is followed by ion-scattering methods, optics, optical diffraction, microscopy, and ellipsometry. Generalization of Fraunhofer diffraction to scattering by a three-dimensional arrangement of atoms in crystals leads to X-ray, electron, and neutron diffraction methods, both from surfaces and the bulk. Discussion of transmission and analytical electron microscopy, including recent developments, is followed by chapters on scanning electron microscopy and scanning probe microscopies. The book concludes with elaborate tables to provide a convenient and easily accessible way of summarizing the key points, features, and inter-relatedness of the different spectroscopy, diffraction, and imaging techniques presented throughout. Principles of Materials Characterization and Metrology uniquely combines a discussion of the physical principles and practical application of these characterization techniques to explain and illustrate the fundamental properties of a wide range of materials in a tool-based approach. Based on forty years of teaching and research, this book incorporates worked examples, to test the reader's knowledge with extensive questions and exercises.

Students and researchers looking for a comprehensive textbook on magnetism, magnetic materials and related applications will find in this book an excellent explanation of the field. Chapters progress logically from the physics of magnetism, to magnetic phenomena in materials, to size and dimensionality effects, to applications. Beginning with a description of magnetic phenomena and measurements on a macroscopic scale, the book then presents discussions of intrinsic and phenomenological concepts of magnetism such as electronic magnetic moments and classical, quantum, and band theories of magnetic behavior. It then covers ordered magnetic materials (emphasizing their structure-sensitive properties) and magnetic phenomena, including magnetic anisotropy, magnetostriction, and magnetic domain structures and dynamics. What follows is a comprehensive description of imaging methods to resolve magnetic microstructures (domains) along with an introduction to micromagnetic modeling. The book then explores in detail size (small particles) and dimensionality (surface and interfaces) effects - the underpinnings of nanoscience and nanotechnology that are brought into sharp focus by magnetism. The hallmark of modern science is its interdisciplinarity, and the second half of the book offers interdisciplinary discussions of information technology, magnetoelectronics and the future of biomedicine via recent developments in magnetism. Modern materials with tailored properties require careful synthetic and characterization strategies. The book also includes relevant details of the chemical synthesis of small particles and the physical deposition of ultra thin films. In addition, the book presents details of state-of-the-art characterization methods and summaries of representative families of materials, including tables of properties. CGS equivalents (to SI) are included.

Students and researchers looking for a comprehensive textbook on magnetism, magnetic materials and related applications will find in this book an excellent explanation of the field. Chapters progress logically from the physics of magnetism, to magnetic phenomena in materials, to size and dimensionality effects, to applications. Beginning with a description of magnetic phenomena and measurements on a macroscopic scale, the book then presents discussions of intrinsic and phenomenological concepts of magnetism such as electronic magnetic moments and classical, quantum, and band theories of magnetic behavior. It then covers ordered magnetic materials (emphasizing their structure-sensitive properties) and magnetic phenomena, including magnetic anisotropy, magnetostriction, and magnetic domain structures and dynamics. What follows is a comprehensive description of imaging methods to resolve magnetic microstructures (domains) along with an introduction to micromagnetic modeling. The book then explores in detail size (small particles) and dimensionality (surface and interfaces) effects - the underpinnings of nanoscience and nanotechnology that are brought into sharp focus by magnetism. The hallmark of modern science is its interdisciplinarity, and the second half of the book offers interdisciplinary discussions of information technology, magnetoelectronics and the future of biomedicine via recent developments in magnetism. Modern materials with tailored properties require careful synthetic and characterization strategies. The book also includes relevant details of the chemical synthesis of small particles and the physical deposition of ultra thin films. In addition, the book presents details of state-of-the-art characterization methods and summaries of representative families of materials, including tables of properties. CGS equivalents (to SI) are included.