"Phase Change Materials: Science and Applications" provides a unique introduction of this rapidly developing field. Clearly written and well-structured, this volume describes the material science of these fascinating materials from a theoretical and experimental perspective. Readers will find an in-depth description of their existing and potential applications in optical and solid state storage devices as well as reconfigurable logic applications.

Researchers, graduate students and scientists with an interest in this field will find "Phase Change Materials" to be a valuable reference.

This research monograph discusses the close correlation between the magnetic and structural properties of thin films in the context of numerous examples of epitaxial metal films, while emphasis is laid on the stabilization of novel structures compared to the bulk material. Further options, possibilities, and limits for applications are given. Techniques for the characterization of thin films are addressed as well.

With the multiple overwrite feature, rewritable optical discs have found application in consumer DVD+RW video recorders, professional archiving systems and computer drives for data storage, replacing the floppy disc in the latter case. Optical Data Storage provides an overview of the recording principles, materials aspects, and application areas of phase-change optical storage. Some theoretical background is given to familiarize the reader with the basics of the phase-change processes. Elements of data recording, including mark formation, eraseability, direct overwrite strategies, data quality and data stability, etc. are explained and extensively discussed. A mark formation model is described and used throughout the whole book to back up measurement results and support the applications discussed. Two major aspects - high-speed and dual-layer recording are considered in depth and solutions to achieve higher performance are analyzed.

"Phase Change Materials: Science and Applications" provides a unique introduction of this rapidly developing field. Clearly written and well-structured, this volume describes the material science of these fascinating materials from a theoretical and experimental perspective. Readers will find an in-depth description of their existing and potential applications in optical and solid state storage devices as well as reconfigurable logic applications.

Researchers, graduate students and scientists with an interest in this field will find "Phase Change Materials" to be a valuable reference.

Optical data storage represents a major chapter in the history of information storage and the invention of rewritable media has indisputably been an essential addition to the optical storage family. With the multiple overwrite feature, rewritable optical discs have found application in consumer DVD+RW video recorders, professional archiving systems and computer drives for data storage, replacing the floppy disc in the latter case.

Optical Data Storage provides an overview of the recording principles, materials aspects, and application areas of phase-change optical storage. Some theoretical background is given to familiarize the reader with the basics of the phase-change processes. Elements of data recording, including mark formation, eraseability, direct overwrite strategies, data quality and data stability, etc are explained and extensively discussed. A mark formation model is described and used throughout the whole book to back-up measurement results and support the discussed applications. Two major aspects high-speed and dual-layer recording are considered in depth and solutions to achieve higher performance are analyzed.

Optical Data Storage is aimed at a broad range of readers from university teams studying the subject to industrial media manufacturers requiring insights into performance of rewritable optical media."

This research monograph discusses the close correlation between the magnetic and structural properties of thin films in the context of numerous examples of epitaxial metal films, while emphasis is laid on the stabilization of novel structures compared to the bulk material. Further options, possibilities, and limits for applications are given. Techniques for the characterization of thin films are addressed as well.