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Secondary ion mass spectrometry (SIMS), in which energetic ions are
implemented to interrogate the surface, is an efficient technique
for the molecular analysis and imaging of solid surfaces. Improving
the yield of secondary ions remains a challenge in SIMS.
Metal-Assisted SIMS (MetA SIMS), where a small quantity of metal
(Au, Ag, Pt...) is condensed on the sample surface, was one among
the proposed ways to increase the yield using keV monatomic
projectiles. In this thesis, the yield enhancements obtained upon
12 keV Ga+, 30 keV Bin+ (n =1,3,5) and 6MeV O3+ bombardment on
metal deposited organic materials are investigated. Following from
the studies in Metal Assisted Secondary Ion Mass Spectrometry (MetA
SIMS), gold nanoparticles condensed on the surface of organic
materials were used as an alternative to the Matrix-Assisted Laser
Desorption Ionization (MALDI). The results suggest that
Metal-Assisted LDI (MetA LDI) provides an interesting alternative
to MALDI for the surface analysis and, potentially, imaging of
certain classes of materials, when a minimal perturbation of the
surface structure is desired.
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