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This volume contains the proceedings of the Fifth International
Confer- ence on Secondary Ion Mass Spectrometry (SIMS V), held at
the Capitol Holiday Inn, Washington, DC, USA, from September 30 to
October 4, 1985. The conference was the fifth in a series of
conferences held bienni- ally. Previous conferences were held in
Miinster (1977), Stanford (1979), Budapest (1981), and Osaka
(1983). SIMS V was organized by Dr. R. J. Colton of the Nayal
Research Lab- oratory and Dr. D. S. Simons of the National Bureau
of Standards un- der the auspices of the International Organizing
Committee chaired by Prof. A. Benninghoven of the Universitat
Miinster. Dr. Richard F. K. Herzog served as the honorary chairman
of SIMS V. While Dr. Herzog is best known to the mass spectrometry
community for his theoretical development of a mass spectrometer
design, known as the Mattauch-Herzog geometry, he also made several
early and impor- tant contributions to SIMS. In 1949, Herzog and
Viehbock published a description of the first instrument designed
to study secondary ions pro- duced by bombardment from a beam of
ions generated in a source that was separated from the sample by a
narrow tube. Later at the GCA Cor- poration, he brought together a
team of researchers including H. J. Liebl, F. G. Riidenauer, W. P.
Poschenrieder and F. G. Satkiewicz, who designed and built, and
carried out applied research with the first commercial ion
microprobe.
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