Carbonate cements are very common and abundant in clastic sequences. They profoundly influence the quality of hydrocarbon reservoirs and supply important information on palaeoenvironments and the chemical composition and flow patterns of fluids in sedimentary basins. Despite this importance, their distribution patterns in time and space and their geochemical evolution are not yet deeply explored and elucidated. This Special Publication contains 21 review papers and case studies on carbonate cementation in clastic sequences written by invited specialists on the subject. These papers present a wide and deep coverage that enhance our knowledge about carbonate cementation in various clastic depositional environments, tectonic settings and burial histories. The book will be of special interest to researchers, petroleum geologists and teachers and students at the postgraduate level.

If you are a member of the International Association of Sedimentologists, for purchasing details, please see: http: //www.iasnet.org/publications/details.asp?code=SP26

A pragmatic approach to testing electronic systems

As we move ahead in the electronic age, rapid changes in technology pose an ever-increasing number of challenges in testing electronic products. Many practicing engineers are involved in this arena, but few have a chance to study the field in a systematic way–learning takes place on the job. By covering the fundamental disciplines in detail, Principles of Testing Electronic Systems provides design engineers with the much-needed knowledge base.

Divided into five major parts, this highly useful reference relates design and tests to the development of reliable electronic products; shows the main vehicles for design verification; examines designs that facilitate testing; and investigates how testing is applied

to random logic, memories, FPGAs, and microprocessors. Finally, the last part offers coverage of advanced test solutions for today’s very deep submicron designs. The authors take a phenomenological approach to the subject matter while providing readers with plenty of opportunities to explore the foundation in detail. Special features include:

• An explanation of where a test belongs in the design flow
• Detailed discussion of scan-path and ordering of scan-chains
• BIST solutions for embedded logic and memory blocks
• Test methodologies for FPGAs
• A chapter on testing system on a chip
• Numerous references