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In the last few years CMOS technology has become increas ingly
dominant for realizing Very Large Scale Integrated (VLSI) circuits.
The popularity of this technology is due to its high den sity and
low power requirement. The ability to realize very com plex
circuits on a single chip has brought about a revolution in the
world of electronics and computers. However, the rapid advance
ments in this area pose many new problems in the area of testing.
Testing has become a very time-consuming process. In order to ease
the burden of testing, many schemes for designing the circuit for
improved testability have been presented. These design for
testability techniques have begun to catch the attention of chip
manufacturers. The trend is towards placing increased emphasis on
these techniques. Another byproduct of the increase in the
complexity of chips is their higher susceptibility to faults. In
order to take care of this problem, we need to build fault-tolerant
systems. The area of fault-tolerant computing has steadily gained
in importance. Today many universities offer courses in the areas
of digital system testing and fault-tolerant computing. Due to the
impor tance of CMOS technology, a significant portion of these
courses may be devoted to CMOS testing. This book has been written
as a reference text for such courses offered at the senior or
graduate level. Familiarity with logic design and switching theory
is assumed. The book should also prove to be useful to
professionals working in the semiconductor industry."
In the last few years CMOS technology has become increas ingly
dominant for realizing Very Large Scale Integrated (VLSI) circuits.
The popularity of this technology is due to its high den sity and
low power requirement. The ability to realize very com plex
circuits on a single chip has brought about a revolution in the
world of electronics and computers. However, the rapid advance
ments in this area pose many new problems in the area of testing.
Testing has become a very time-consuming process. In order to ease
the burden of testing, many schemes for designing the circuit for
improved testability have been presented. These design for
testability techniques have begun to catch the attention of chip
manufacturers. The trend is towards placing increased emphasis on
these techniques. Another byproduct of the increase in the
complexity of chips is their higher susceptibility to faults. In
order to take care of this problem, we need to build fault-tolerant
systems. The area of fault-tolerant computing has steadily gained
in importance. Today many universities offer courses in the areas
of digital system testing and fault-tolerant computing. Due to the
impor tance of CMOS technology, a significant portion of these
courses may be devoted to CMOS testing. This book has been written
as a reference text for such courses offered at the senior or
graduate level. Familiarity with logic design and switching theory
is assumed. The book should also prove to be useful to
professionals working in the semiconductor industry."
Publisher's Note: Products purchased from Third Party sellers are
not guaranteed by the publisher for quality, authenticity, or
access to any online entitlements included with the product.
Cutting-Edge CMOS VLSI Design for Manufacturability TechniquesThis
detailed guide offers proven methods for optimizing circuit designs
to increase the yield, reliability, and manufacturability of
products and mitigate defects and failure. Covering the latest
devices, technologies, and processes, Nanoscale CMOS VLSI Circuits:
Design for Manufacturability focuses on delivering higher
performance and lower power consumption. Costs, constraints, and
computational efficiencies are also discussed in the practical
resource. Nanoscale CMOS VLSI Circuits covers: Current trends in
CMOS VLSI design Semiconductor manufacturing technologies
Photolithography Process and device variability: analyses and
modeling Manufacturing-Aware Physical Design Closure Metrology,
manufacturing defects, and defect extraction Defect impact modeling
and yield improvement techniques Physical design and reliability
DFM tools and methodologies
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