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RFID Technology and Applications (Hardcover): Stephen B Miles, Sanjay E Sarma, John R. Williams RFID Technology and Applications (Hardcover)
Stephen B Miles, Sanjay E Sarma, John R. Williams
R3,548 R3,164 Discovery Miles 31 640 Save R384 (11%) Ships in 12 - 17 working days

Are you an engineer or manager working on the development and implementation of RFID technology? If so, this book is for you. Covering both passive and active RFID systems, the challenges to RFID implementation are addressed using specific industry research examples and common integration issues. Key topics include RF tag performance optimization, evaluation methodologies for RFID and Real-Time-Location Systems (RTLS) and sensors, EPC network simulation, RFID in the retail supply chain, and applications in product lifecycle management, anti-counterfeiting and cold chain management. The book brings together insights from the world's leading research laboratories in the field, including the Auto-ID Labs at MIT, successor to the Auto-ID Center which developed the Electronic Product Code scheme which is set to become the global standard for product identification.MIT Auto-ID Labs's suite of Open Source code and tools for RFID implementation is available at www.cambridge.org/9780521880930.

RFID Technology and Applications (Paperback): Stephen B Miles, Sanjay E Sarma, John R. Williams RFID Technology and Applications (Paperback)
Stephen B Miles, Sanjay E Sarma, John R. Williams
R1,273 Discovery Miles 12 730 Ships in 12 - 17 working days

Are you an engineer or manager working on the development and implementation of RFID technology? If so, this book is for you. Covering both passive and active RFID systems, the challenges to RFID implementation are addressed using specific industry research examples and common integration issues. Key topics include RF tag performance optimization, evaluation methodologies for RFID and Real-Time-Location Systems (RTLS) and sensors, EPC network simulation, RFID in the retail supply chain, and applications in product lifecycle management, anti-counterfeiting and cold chain management. The book brings together insights from the world's leading research laboratories in the field, including the Auto-ID Labs at MIT, successor to the Auto-ID Center which developed the Electronic Product Code scheme which is set to become the global standard for product identification.MIT Auto-ID Labs's suite of Open Source code and tools for RFID implementation is available at www.cambridge.org/9780521880930.

The Internet of Things - First International Conference, IOT 2008, Zurich, Switzerland, March 26-28, 2008, Proceedings... The Internet of Things - First International Conference, IOT 2008, Zurich, Switzerland, March 26-28, 2008, Proceedings (Paperback, 2008 ed.)
Christian Floerkemeier, Marc Langheinrich, Elgar Fleisch, Friedemann Mattern, Sanjay E Sarma
R1,500 Discovery Miles 15 000 Ships in 10 - 15 working days

ThisvolumecontainstheproceedingsoftheInternetofThings(IOT)Conference 2008, the ?rst international conference of its kind. The conference took place in Zurich, Switzerland, March26-28,2008. The term 'Internet of Things' hascome to describe a number of technologies and researchdisciplines that enable the - ternet to reach out into the real world of physical objects. Technologies such as RFID, short-range wireless communications, real-time localization, and sensor networks are becoming increasingly common, bringing the 'Internet of Things' into industrial, commercial, and domestic use. IOT 2008 brought together le- ing researchersand practitioners, from both academia and industry, to facilitate the sharing of ideas, applications, and research results. IOT 2008 attracted 92 high-quality submissions, from which the technical program committee accepted 23 papers, resulting in a competitive 25% acc- tance rate. In total, there were over 250 individual authors from 23 countries, representing both academic and industrial organizations. Papers were selected solely on the quality of their blind peer reviews. We were fortunate to draw on the combined experience of our 59 program committee members, coming from the most prestigious universities and research labs in Europe, North America, Asia, and Australia. Program committee members were aided by no less than 63 external reviewers in this rigorous process, in which each committee member wrote about 6 reviews. The total of 336 entered reviews resulted in an average of 3. 7 reviews per paper, or slightly more than 1000 words of feedback for each paper submitted.

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