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Semiconductor Power Devices - Physics, Characteristics, Reliability (Hardcover, 2nd ed. 2018): Josef Lutz, Heinrich... Semiconductor Power Devices - Physics, Characteristics, Reliability (Hardcover, 2nd ed. 2018)
Josef Lutz, Heinrich Schlangenotto, Uwe Scheuermann, Rik de Doncker
R7,727 Discovery Miles 77 270 Ships in 12 - 19 working days

Halbleiter-Leistungsbauelemente sind das Kernstuck der Leistungselektronik. Sie bestimmen die Leistungsfahigkeit und machen neuartige und verlustarme Schaltungen erst moeglich. In dem Band wird neben den Halbleiter-Leistungsbauelementen selbst auch die Aufbau- und Verbindungstechnik behandelt: von den physikalischen Grundlagen und der Herstellungstechnologie uber einzelne Bauelemente bis zu thermomechanischen Problemen, Zerstoerungsmechanismen und Stoerungseffekten. Die 2., uberarbeitete Auflage berucksichtigt technische Neuerungen und Entwicklungen.

Semiconductor Power Devices - Physics, Characteristics, Reliability (Paperback, Softcover reprint of the original 2nd ed.... Semiconductor Power Devices - Physics, Characteristics, Reliability (Paperback, Softcover reprint of the original 2nd ed. 2018)
Josef Lutz, Heinrich Schlangenotto, Uwe Scheuermann, Rik de Doncker
R6,444 Discovery Miles 64 440 Ships in 10 - 15 working days

Halbleiter-Leistungsbauelemente sind das Kernstuck der Leistungselektronik. Sie bestimmen die Leistungsfahigkeit und machen neuartige und verlustarme Schaltungen erst moeglich. In dem Band wird neben den Halbleiter-Leistungsbauelementen selbst auch die Aufbau- und Verbindungstechnik behandelt: von den physikalischen Grundlagen und der Herstellungstechnologie uber einzelne Bauelemente bis zu thermomechanischen Problemen, Zerstoerungsmechanismen und Stoerungseffekten. Die 2., uberarbeitete Auflage berucksichtigt technische Neuerungen und Entwicklungen.

Semiconductor Power Devices (Hardcover, 2011): Josef Lutz, Heinrich Schlangenotto, Uwe Scheuermann, Rik de Doncker Semiconductor Power Devices (Hardcover, 2011)
Josef Lutz, Heinrich Schlangenotto, Uwe Scheuermann, Rik de Doncker
R5,643 Discovery Miles 56 430 Ships in 12 - 19 working days

Semiconductor power devices are the heart of power electronics. They determine the performance of power converters and allow topologies with high efficiency. Semiconductor properties, pn-junctions and the physical phenomena for understanding power devices are discussed in depth. Working principles of state-of-the-art power diodes, thyristors, MOSFETs and IGBTs are explained in detail, as well as key aspects of semiconductor device production technology. In practice, not only the semiconductor, but also the thermal and mechanical properties of packaging and interconnection technologies are essential to predict device behavior in circuits. Wear and aging mechanisms are identified and reliability analyses principles are developed. Unique information on destructive mechanisms, including typical failure pictures, allows assessment of the ruggedness of power devices. Also parasitic effects, such as device induced electromagnetic interference problems, are addressed. The book concludes with modern power electronic system integration techniques and trends.

Semiconductor Power Devices - Physics, Characteristics, Reliability (Paperback, 2011 ed.): Josef Lutz, Heinrich Schlangenotto,... Semiconductor Power Devices - Physics, Characteristics, Reliability (Paperback, 2011 ed.)
Josef Lutz, Heinrich Schlangenotto, Uwe Scheuermann, Rik de Doncker
R4,398 Discovery Miles 43 980 Ships in 10 - 15 working days

Semiconductor power devices are the heart of power electronics. They determine the performance of power converters and allow topologies with high efficiency. Semiconductor properties, pn-junctions and the physical phenomena for understanding power devices are discussed in depth. Working principles of state-of-the-art power diodes, thyristors, MOSFETs and IGBTs are explained in detail, as well as key aspects of semiconductor device production technology. In practice, not only the semiconductor, but also the thermal and mechanical properties of packaging and interconnection technologies are essential to predict device behavior in circuits. Wear and aging mechanisms are identified and reliability analyses principles are developed. Unique information on destructive mechanisms, including typical failure pictures, allows assessment of the ruggedness of power devices. Also parasitic effects, such as device induced electromagnetic interference problems, are addressed. The book concludes with modern power electronic system integration techniques and trends.

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