0
Your cart

Your cart is empty

Browse All Departments
  • All Departments
Price
  • R2,500 - R5,000 (2)
  • -
Status
Brand

Showing 1 - 2 of 2 matches in All Departments

Surface Infrared and Raman Spectroscopy - Methods and Applications (Paperback, Softcover reprint of the original 1st ed. 1995):... Surface Infrared and Raman Spectroscopy - Methods and Applications (Paperback, Softcover reprint of the original 1st ed. 1995)
W. Suetaka; Assisted by John T. Yates Jr
R2,955 Discovery Miles 29 550 Ships in 10 - 15 working days

are intended to fill the gap between a manufacturer's handbook, and review articles that highlight the latest scientific developments. A fourth volume will deal with techniques for specimen handling, beam artifacts, and depth profiling. It will provide a compilation of methods that have proven useful for specimen handling and treatment, and it will also address the common artifacts and problems associated with the bombardment of solid sur faces by photons, electrons, and ions. A description will be given of methods for depth profiling. Surface characterization measurements are being used increasingly in di verse areas of science and technology. We hope that this series will be useful in ensuring that these measurements can be made as efficiently and reliably as possible. Comments on the series are welcomed, as are suggestions for volumes on additional topics. C. J. Powell Gaithersburg, Maryland A. W. Czandema Golden, Colorado D. M. Hercules Pittsburgh, Pennsylvania T. E. Madey New Brunswick, New Jersey J. T. Yates, Jr."

Surface Infrared and Raman Spectroscopy - Methods and Applications (Hardcover, 1995 ed.): W. Suetaka Surface Infrared and Raman Spectroscopy - Methods and Applications (Hardcover, 1995 ed.)
W. Suetaka; Assisted by John T. Yates Jr
R3,134 Discovery Miles 31 340 Ships in 10 - 15 working days

are intended to fill the gap between a manufacturer's handbook, and review articles that highlight the latest scientific developments. A fourth volume will deal with techniques for specimen handling, beam artifacts, and depth profiling. It will provide a compilation of methods that have proven useful for specimen handling and treatment, and it will also address the common artifacts and problems associated with the bombardment of solid sur faces by photons, electrons, and ions. A description will be given of methods for depth profiling. Surface characterization measurements are being used increasingly in di verse areas of science and technology. We hope that this series will be useful in ensuring that these measurements can be made as efficiently and reliably as possible. Comments on the series are welcomed, as are suggestions for volumes on additional topics. C. J. Powell Gaithersburg, Maryland A. W. Czandema Golden, Colorado D. M. Hercules Pittsburgh, Pennsylvania T. E. Madey New Brunswick, New Jersey J. T. Yates, Jr."

Free Delivery
Pinterest Twitter Facebook Google+
You may like...
Shield Fresh 24 Mist Spray (Vanilla…
R19 Discovery Miles 190
A Desire To Return To The Ruins - A Look…
Lucas Ledwaba Paperback R287 Discovery Miles 2 870
The High Notes
Danielle Steel Paperback R340 R266 Discovery Miles 2 660
Coolaroo Elevated Pet Bed (L)(Brunswick…
R990 R729 Discovery Miles 7 290
Hot Wheels Aluminium Bottle…
R129 R69 Discovery Miles 690
Spider-Man: 5-Movie Collection…
Tobey Maguire, Kirsten Dunst, … Blu-ray disc  (1)
R466 Discovery Miles 4 660
Huntlea Koletto - Matlow Pet Bed…
R969 R449 Discovery Miles 4 490
Crystal Aire Concentrate - Ocean Mist…
R199 Discovery Miles 1 990
Fast & Furious: 8-Film Collection
Vin Diesel, Paul Walker, … Blu-ray disc R433 Discovery Miles 4 330
Bostik Glue Stick (40g)
R52 Discovery Miles 520

 

Partners