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Vol. 2 of "Progress in Materials Analysis" contains the lectures of
the 12th Colloquium on Materials Analysis, Vienna, May 13-15, 1985.
Due to the top level international participation from industry and
research insti tutions the proceedings offer a survey of the
present state and current trends in materials analysis of high
actuality. The major topics covered are surface, micro and trace
analysis of materials with a special emphasis on metals but also
including other materials like ceramics, semiconductors, polymers.
According to the strategy of the meeting attention is focussed on
an interdisciplinary approach to materials science - combining
analytical chemistry, solid state physics and technol ogy.
Therefore progress reports on modern analytical technique like
SIMS, SNMS, AES, XPS, Positron Annihilation Spectroscopy, EPMA,
STEM, LAMMS, etc. are contained as well as presentations on the
development of materials. The majority of the contributions centers
on the treatment of important problems in materials science and
technology by a (mostly sophisticated) combination of physical and
chemical analytical techniques. Vienna, July 1985 M. Grasserbauer
Contents Page Hercules, D. M. Surface Characterization of Thin
Organic Films on Metals
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The journal Chemometrics and Intelligent Laboratory Systems has a
specific policy of publishing tutorial papers, (i.e. articles
aiming to discuss and illustrate the application of chemometric and
other techniques) solicited from leading experts in the varied
disciplines relating to this subject. This book comprises reprints
of tutorials from the first 5 volumes of this journal, covering the
period from late 1986 to mid 1989. The authors of the papers
include analytical, organic and environmental chemists,
statisticians, pharmacologists, geologists, geochemists, computer
scientists and biologists, which reflects the strong
interdisciplinary communication. The papers have been reorganized
into major themes, covering most of the main areas of chemometrics.
This book is intended both as a personal reference text and as a
useful background for courses in chemometrics and laboratory
computing.
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