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Introduction to Quantum Metrology - The Revised SI System and Quantum Standards (Hardcover, 2nd ed. 2019): Waldemar Nawrocki Introduction to Quantum Metrology - The Revised SI System and Quantum Standards (Hardcover, 2nd ed. 2019)
Waldemar Nawrocki
R4,645 Discovery Miles 46 450 Ships in 10 - 15 working days

This book discusses the theory of quantum effects used in metrology, and presents the author's research findings in the field of quantum electronics. It also describes the quantum measurement standards used in various branches of metrology, such as those relating to electrical quantities, mass, length, time and frequency. The first comprehensive survey of quantum metrology problems, it introduces a new approach to metrology, placing a greater emphasis on its connection with physics, which is of importance for developing new technologies, nanotechnology in particular. Presenting practical applications of the effects used in quantum metrology for the construction of quantum standards and sensitive electronic components, the book is useful for a broad range of physicists and metrologists. It also promotes a better understanding and approval of the new system in both industry and academia. This second edition includes two new chapters focusing on the revised SI system and satellite positioning systems. Practical realization (mise en pratique) the base units (metre, kilogram, second, ampere, kelvin, candela, and mole), new defined in the revised SI, is presented in details. Another new chapter describes satellite positioning systems and their possible applications. In satellite positioning systems, like GPS, GLONASS, BeiDou and Galileo, quantum devices - atomic clocks - serve wide population of users.

Introduction to Quantum Metrology - The Revised SI System and Quantum Standards (Paperback, 2nd ed. 2019): Waldemar Nawrocki Introduction to Quantum Metrology - The Revised SI System and Quantum Standards (Paperback, 2nd ed. 2019)
Waldemar Nawrocki
R4,703 Discovery Miles 47 030 Ships in 18 - 22 working days

This book discusses the theory of quantum effects used in metrology, and presents the author's research findings in the field of quantum electronics. It also describes the quantum measurement standards used in various branches of metrology, such as those relating to electrical quantities, mass, length, time and frequency. The first comprehensive survey of quantum metrology problems, it introduces a new approach to metrology, placing a greater emphasis on its connection with physics, which is of importance for developing new technologies, nanotechnology in particular. Presenting practical applications of the effects used in quantum metrology for the construction of quantum standards and sensitive electronic components, the book is useful for a broad range of physicists and metrologists. It also promotes a better understanding and approval of the new system in both industry and academia. This second edition includes two new chapters focusing on the revised SI system and satellite positioning systems. Practical realization (mise en pratique) the base units (metre, kilogram, second, ampere, kelvin, candela, and mole), new defined in the revised SI, is presented in details. Another new chapter describes satellite positioning systems and their possible applications. In satellite positioning systems, like GPS, GLONASS, BeiDou and Galileo, quantum devices - atomic clocks - serve wide population of users.

Introduction to Quantum Metrology - Quantum Standards and Instrumentation (Paperback, Softcover reprint of the original 1st ed.... Introduction to Quantum Metrology - Quantum Standards and Instrumentation (Paperback, Softcover reprint of the original 1st ed. 2015)
Waldemar Nawrocki
R4,293 Discovery Miles 42 930 Ships in 18 - 22 working days

This book presents the theory of quantum effects used in metrology and results of the author’s own research in the field of quantum electronics. The book provides also quantum measurement standards used in many branches of metrology for electrical quantities, mass, length, time and frequency. This book represents the first comprehensive survey of quantum metrology problems. As a scientific survey, it propagates a new approach to metrology with more emphasis on its connection with physics. This is of importance for the constantly developing technologies and nanotechnologies in particular. Providing a presentation of practical applications of the effects used in quantum metrology for the construction of quantum standards and sensitive electronic components, the book is useful for a wide audience of physicists and metrologists in the broad sense of both terms. In 2014 a new system of units, the so called Quantum SI, is introduced. This book helps to understand and approve the new system to both technology and academic community.

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