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Proceedings of 2018 International Conference on Optoelectronics and Measurement (Hardcover, 1st ed. 2020): Ying-quan Peng,... Proceedings of 2018 International Conference on Optoelectronics and Measurement (Hardcover, 1st ed. 2020)
Ying-quan Peng, Xinyong Dong
R4,266 Discovery Miles 42 660 Ships in 10 - 15 working days

This book gathers selected papers from the first International Conference on Optoelectronics and Measurement (ICOM 2018), held in Hangzhou, China on Oct 18-20, 2018. The proceedings focus on the latest developments in the fields of optics, photonics, optoelectronics, sensors, and related measurement technologies. Addressing hot topics in fibre optics, photo detectors and sensors, it also features illustrations of advanced device technologies, explains measurement principles, and shares cutting-edge scientific and technological findings. Accordingly, readers will gain essential insights into the forefront of these fields, and will find not only important technical data, but also new ideas to inspire their own future research.

Proceedings of 2019 International Conference on Optoelectronics and Measurement (Hardcover, 1st ed. 2021): Ying-quan Peng,... Proceedings of 2019 International Conference on Optoelectronics and Measurement (Hardcover, 1st ed. 2021)
Ying-quan Peng, Xinyong Dong
R6,171 Discovery Miles 61 710 Ships in 10 - 15 working days

This book presents high-quality papers from the 2019 International Conference on Optoelectronics and Measurement (ICOM2019) which was held on November 28-30, 2019, in Hangzhou, China. It focuses on the latest developments in the fields of optics, photonics, optoelectronics, sensors, and related measurement technology. Being closely related to either the key device technology or the important commercial applications, topics of fiber optics, photodetectors, sensors, and measurement technology are of particular interest for the readers. The book contains the illustrations of advanced device technologies, measurement principles, as well as scientific and technological conclusions of the great reference value. The readers will gain deep insight into the latest development in the related fields, obtain important technical data and scientific conclusions, and inspire new ideas for their research.

Advanced Material Engineering - Proceedings Of The 2015 International Conference (Hardcover): Yongchang Liu, Ying-quan Peng Advanced Material Engineering - Proceedings Of The 2015 International Conference (Hardcover)
Yongchang Liu, Ying-quan Peng
R6,696 Discovery Miles 66 960 Ships in 10 - 15 working days

This book represents a collection of papers presented at the 2015 International Conference on Advanced Material Engineering (AME 2015), held in Guangzhou, China. With the rapid development of industry and information technology, researchers across all fields began to discuss new ideas related to materials science and manufacturing technology. This proceedings provide a valuable insight from researchers and scientists who exchanged their ideas in the conference.

Proceedings of 2019 International Conference on Optoelectronics and Measurement (Paperback, 1st ed. 2021): Ying-quan Peng,... Proceedings of 2019 International Conference on Optoelectronics and Measurement (Paperback, 1st ed. 2021)
Ying-quan Peng, Xinyong Dong
R6,141 Discovery Miles 61 410 Ships in 10 - 15 working days

This book presents high-quality papers from the 2019 International Conference on Optoelectronics and Measurement (ICOM2019) which was held on November 28-30, 2019, in Hangzhou, China. It focuses on the latest developments in the fields of optics, photonics, optoelectronics, sensors, and related measurement technology. Being closely related to either the key device technology or the important commercial applications, topics of fiber optics, photodetectors, sensors, and measurement technology are of particular interest for the readers. The book contains the illustrations of advanced device technologies, measurement principles, as well as scientific and technological conclusions of the great reference value. The readers will gain deep insight into the latest development in the related fields, obtain important technical data and scientific conclusions, and inspire new ideas for their research.

Proceedings of 2018 International Conference on Optoelectronics and Measurement (Paperback, 1st ed. 2020): Ying-quan Peng,... Proceedings of 2018 International Conference on Optoelectronics and Measurement (Paperback, 1st ed. 2020)
Ying-quan Peng, Xinyong Dong
R4,235 Discovery Miles 42 350 Ships in 10 - 15 working days

This book gathers selected papers from the first International Conference on Optoelectronics and Measurement (ICOM 2018), held in Hangzhou, China on Oct 18-20, 2018. The proceedings focus on the latest developments in the fields of optics, photonics, optoelectronics, sensors, and related measurement technologies. Addressing hot topics in fibre optics, photo detectors and sensors, it also features illustrations of advanced device technologies, explains measurement principles, and shares cutting-edge scientific and technological findings. Accordingly, readers will gain essential insights into the forefront of these fields, and will find not only important technical data, but also new ideas to inspire their own future research.

Charge Carrier Transport in Organic Semiconductor Thin Film Devices (Hardcover): Ying-quan Peng, Fei-ping Lu Qing-sen Yang,... Charge Carrier Transport in Organic Semiconductor Thin Film Devices (Hardcover)
Ying-quan Peng, Fei-ping Lu Qing-sen Yang, Hong-wei Xing, Xun-Shuan Li
R1,082 R810 Discovery Miles 8 100 Save R272 (25%) Ships in 12 - 17 working days

In this book we investigate mechanism of charge carrier transport in organic semiconductor thin film devices (OTFDs). Numerical models for the current conduction in single layer OTFDs including both injection and bulk effect for both trap free organics as well as organics with traps exponentially distributed in energy are developed. The dependencies of the current density on the operation voltage, the thickness of the organic layer and the trap properties are numerically studied.

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