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As the characteristic dimensions of electronic devices continue to
shrink, the ability to characterize their electronic properties at
the nanometer scale has come to be of outstanding importance. In
this sense, Scanning Probe Microscopy (SPM) is becoming an
indispensable tool, playing a key role in nanoscience and
nanotechnology. SPM is opening new opportunities to measure
semiconductor electronic properties with unprecedented spatial
resolution. SPM is being successfully applied for nanoscale
characterization of ferroelectric thin films. In the area of
functional molecular materials it is being used as a probe to
contact molecular structures in order to characterize their
electrical properties, as a manipulator to assemble nanoparticles
and nanotubes into simple devices, and as a tool to pattern
molecular nanostructures. This book provides in-depth information
on new and emerging applications of SPM to the field of materials
science, namely in the areas of characterisation, device
application and nanofabrication of functional materials. Starting
with the general properties of functional materials the authors
present an updated overview of the fundamentals of Scanning Probe
Techniques and the application of SPM techniques to the
characterization of specified functional materials such as
piezoelectric and ferroelectric and to the fabrication of some nano
electronic devices. Its uniqueness is in the combination of the
fundamental nanoscale research with the progress in fabrication of
realistic nanodevices. By bringing together the contribution of
leading researchers from the materials science and SPM communities,
relevant information is conveyed that allows researchers to learn
more about the actual developments in SPM applied to functional
materials. This book will contribute to the continuous education
and development in the field of nanotechnology.
As the characteristic dimensions of electronic devices continue to
shrink, the ability to characterize their electronic properties at
the nanometer scale has come to be of outstanding importance. In
this sense, Scanning Probe Microscopy (SPM) is becoming an
indispensable tool, playing a key role in nanoscience and
nanotechnology. SPM is opening new opportunities to measure
semiconductor electronic properties with unprecedented spatial
resolution. SPM is being successfully applied for nanoscale
characterization of ferroelectric thin films. In the area of
functional molecular materials it is being used as a probe to
contact molecular structures in order to characterize their
electrical properties, as a manipulator to assemble nanoparticles
and nanotubes into simple devices, and as a tool to pattern
molecular nanostructures. This book provides in-depth information
on new and emerging applications of SPM to the field of materials
science, namely in the areas of characterisation, device
application and nanofabrication of functional materials. Starting
with the general properties of functional materials the authors
present an updated overview of the fundamentals of Scanning Probe
Techniques and the application of SPM techniques to the
characterization of specified functional materials such as
piezoelectric and ferroelectric and to the fabrication of some nano
electronic devices. Its uniqueness is in the combination of the
fundamental nanoscale research with the progress in fabrication of
realistic nanodevices. By bringing together the contribution of
leading researchers from the materials science and SPM communities,
relevant information is conveyed that allows researchers to learn
more about the actual developments in SPM applied to functional
materials. This book will contribute to the continuous education
and development in the field of nanotechnology.
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