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Books > Earth & environment > Geography > Cartography, geodesy & geographic information systems (GIS) > Remote sensing

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Spatial Statistics for Remote Sensing (Paperback, Softcover reprint of the original 1st ed. 2002) Loot Price: R4,459
Discovery Miles 44 590
Spatial Statistics for Remote Sensing (Paperback, Softcover reprint of the original 1st ed. 2002): A. Stein, Freek D. van der...

Spatial Statistics for Remote Sensing (Paperback, Softcover reprint of the original 1st ed. 2002)

A. Stein, Freek D. van der Meer, Ben Gorte

Series: Remote Sensing and Digital Image Processing, 1

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Loot Price R4,459 Discovery Miles 44 590 | Repayment Terms: R418 pm x 12*

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This book is a collection of papers on spatial statistics for remote sensing. The book emerges from a study day that was organized in 1996 at the International Institute for Aerospace Survey and Earth Sciences, ITC, in Enschede, The Netherlands. It was by several means a memorable event. The beautiful new building, according to a design by the famous modern Dutch architect Max van Huet was just opened, and this workshop was the first to take place there. Of course, much went wrong during the workshop, in particular as the newest electronic equipment regularly failed. But the workshop attrackted more than hundred attendants, and was generally well received. The results of the workshop have been published in Stein et al. (1998). The aim of the workshop was to address issues of spatial statistics for remote sensing. The ITC has a long history on collecting and analyzing satellite and other remote sensing data, but its involvement into spatial statistics is of a more recent date. Uncertainties in remote sensing images and the large amounts of data in many spectral bands are now considered to be of such an impact that it requires a separate approach from a statistical point of view. To quote from the justification of the study day, we read: Modern communication means such as remote sensing require an advanced use of collected data. Satellites collect data with different resolution on different spectral bands.

General

Imprint: Springer-Verlag New York
Country of origin: United States
Series: Remote Sensing and Digital Image Processing, 1
Release date: 2001
First published: 2002
Editors: A. Stein • Freek D. van der Meer • Ben Gorte
Dimensions: 235 x 155 x 16mm (L x W x T)
Format: Paperback
Pages: 284
Edition: Softcover reprint of the original 1st ed. 2002
ISBN-13: 978-1-4020-0551-0
Categories: Books > Earth & environment > Geography > Cartography, geodesy & geographic information systems (GIS) > Geographical information systems (GIS)
Books > Earth & environment > Geography > Cartography, geodesy & geographic information systems (GIS) > Remote sensing
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LSN: 1-4020-0551-2
Barcode: 9781402005510

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