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Books > Professional & Technical > Electronics & communications engineering > Electronics engineering > Circuits & components
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Advanced Test Methods for SRAMs - Effective Solutions for Dynamic Fault Detection in Nanoscaled Technologies (Paperback, 2010 ed.)
Loot Price: R3,028
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Advanced Test Methods for SRAMs - Effective Solutions for Dynamic Fault Detection in Nanoscaled Technologies (Paperback, 2010 ed.)
Expected to ship within 10 - 15 working days
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Modern electronics depend on nanoscaled technologies that present
new challenges in terms of testing and diagnostics. Memories are
particularly prone to defects since they exploit the technology
limits to get the highest density. This book is an invaluable guide
to the testing and diagnostics of the latest generation of SRAM,
one of the most widely applied types of memory. Classical methods
for testing memory are designed to handle the so-called "static
faults," but these test solutions are not sufficient for faults
that are emerging in the latest Very Deep Sub-Micron (VDSM)
technologies. These new fault models, referred to as "dynamic
faults", are not covered by classical test solutions and require
the dedicated test sequences presented in this book.
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