Soft Error Reliability of VLSI Circuits - Analysis and Mitigation Techniques (Hardcover, 1st ed. 2021)

This book is intended for readers who are interested in the design of robust and reliable electronic digital systems. The authors cover emerging trends in design of today's reliable electronic systems which are applicable to safety-critical applications, such as automotive or healthcare electronic systems. The emphasis is on modeling approaches and algorithms for analysis and mitigation of soft errors in nano-scale CMOS digital circuits, using techniques that are the cornerstone of Computer Aided Design (CAD) of reliable VLSI circuits. The authors introduce software tools for analysis and mitigation of soft errors in electronic systems, which can be integrated easily with design flows. In addition to discussing soft error aware analysis techniques for combinational logic, the authors also describe new soft error mitigation strategies targeting commercial digital circuits. Coverage includes novel Soft Error Rate (SER) analysis techniques such as process variation aware SER estimation and GPU accelerated SER analysis techniques, in addition to SER reduction methods such as gate sizing and logic restructuring based SER techniques.

General

Imprint:	Springer Nature Switzerland AG
Country of origin:	Switzerland
Release date:	October 2020
First published:	2021
Authors:	Behnam Ghavami • Mohsen Raji
Dimensions:	235 x 155mm (L x W)
Format:	Hardcover
Pages:	114
Edition:	1st ed. 2021
ISBN-13:	978-3-03-051609-3
Categories:	Books > Professional & Technical > Energy technology & engineering > Electrical engineering > General Books > Professional & Technical > Electronics & communications engineering > Electronics engineering > Circuits & components Promotions
LSN:	3-03-051609-1
Barcode:	9783030516093

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