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A Designer's Guide to Built-In Self-Test (Hardcover, 2002 ed.) Loot Price: R5,324
Discovery Miles 53 240
Repayment Terms: R499 pm x 12*
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A Designer's Guide to Built-In Self-Test (Hardcover, 2002 ed.): Charles E. Stroud

A Designer's Guide to Built-In Self-Test (Hardcover, 2002 ed.)

Charles E. Stroud

Series: Frontiers in Electronic Testing, 19

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Loot Price R5,324 Discovery Miles 53 240 | Repayment Terms: R499 pm x 12*

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A recent technological advance is the art of designing circuits to test themselves, referred to as a Built-In Self-Test. This book is written from a designer's perspective and describes the major BIST approaches that have been proposed and implemented, along with their advantages and limitations.

General

Imprint: Springer-Verlag New York
Country of origin: United States
Series: Frontiers in Electronic Testing, 19
Release date: May 2002
First published: 2002
Authors: Charles E. Stroud
Dimensions: 235 x 155 x 20mm (L x W x T)
Format: Hardcover
Pages: 320
Edition: 2002 ed.
ISBN-13: 978-1-4020-7050-1
Categories: Books > Professional & Technical > Electronics & communications engineering > Electronics engineering > Circuits & components
Books > Professional & Technical > Electronics & communications engineering > Electronics engineering > Electronic devices & materials > General
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LSN: 1-4020-7050-0
Barcode: 9781402070501

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