The 33rd Annual Denver Conference on Applications of X-Ray Analysis
was held July 30-August 3. 1984. on the campus of the University of
Denver. Following the recent tradition of alternating plenary
lecture topics between X-ray diffraction and X-ray fluorescence at
the confer ence. the plenary sessions dealt with topics of X-ray
fluorescence. Prof. H. Aiginger presented a plenary lect re on
TOTAL REFLECTANCE X-RAY SPECTROMETRY which admirably described this
relatively new technique. J. C. Russ discussed XRF AND OTHER
SURFACE ANALYTICAL TECHNIQUES which gave an excellent overview of
the role XRF plays in a modern analytical laboratory. J. E.
Taggart. Jr. described THE ROLE OF XRF IN A MODERN GEOCHEMICAL
LABORATORY and presented many case histories of the configura tion
of analytical equipment in several geochemical laboratories. The
plenary lectures demonstrated both the dynamic nature of research
in X-ray fluorescence. and the important role X-ray spectrom etry
plays in the arsenal of analytical methods found in modern labora
tories. Total reflectance X-ray spectrometry takes advantage of con
sideration of the geometry of the X-ray optics. Potentially. new
sample types may be considered as X-ray fluorescence specimens
using this technique."
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