Introduction to Focused Ion Beam Nanometrology (Paperback)

This book describes modern focused ion beam microscopes and techniques and how they can be used to aid materials metrology and as tools for the fabrication of devices that in turn are used in many other aspects of fundamental metrology. Beginning with a description of the currently available instruments including the new addition to the field of plasma-based sources, it then gives an overview of ion solid interactions and how the different types of instrument can be applied. Chapters then describe how these machines can be applied to the field of materials science and device fabrication giving examples of recent and current activity in both these areas.

General

Imprint:	Morgan & Claypool Publishers
Country of origin:	United States
Series:	IOP Concise Physics
Release date:	October 2015
Authors:	David C. Cox
Dimensions:	254 x 178 x 8mm (L x W x T)
Format:	Paperback
Pages:	104
ISBN-13:	978-1-68174-020-1
Categories:	Books > Science & Mathematics > Science: general issues > Scientific standards Books > Science & Mathematics > Science: general issues > Scientific equipment & techniques, laboratory equipment > General Books > Professional & Technical > Technology: general issues > Instruments & instrumentation engineering > Engineering measurement & calibration
LSN:	1-68174-020-6
Barcode:	9781681740201

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