Electromigration Inside Logic Cells - Modeling, Analyzing and Mitigating Signal Electromigration in NanoCMOS (Hardcover, 1st ed. 2017)

This book describes new and effective methodologies for modeling, analyzing and mitigating cell-internal signal electromigration in nanoCMOS, with significant circuit lifetime improvements and no impact on performance, area and power. The authors are the first to analyze and propose a solution for the electromigration effects inside logic cells of a circuit. They show in this book that an interconnect inside a cell can fail reducing considerably the circuit lifetime and they demonstrate a methodology to optimize the lifetime of circuits, by placing the output, Vdd and Vss pin of the cells in the less critical regions, where the electromigration effects are reduced. Readers will be enabled to apply this methodology only for the critical cells in the circuit, avoiding impact in the circuit delay, area and performance, thus increasing the lifetime of the circuit without loss in other characteristics.

General

Imprint:	Springer International Publishing AG
Country of origin:	Switzerland
Release date:	December 2016
First published:	2017
Authors:	Gracieli Posser • Sachin S Sapatnekar • Ricardo Reis
Dimensions:	235 x 155 x 10mm (L x W x T)
Format:	Hardcover
Pages:	118
Edition:	1st ed. 2017
ISBN-13:	978-3-319-48898-1
Categories:	Books > Professional & Technical > Electronics & communications engineering > Electronics engineering > Circuits & components Books > Computing & IT > Computer hardware & operating systems > Computer architecture & logic design > General
LSN:	3-319-48898-8
Barcode:	9783319488981

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