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Thermal Stress and Strain in Microelectronics Packaging (Paperback, Softcover reprint of the original 1st ed. 1993)
Loot Price: R4,395
Discovery Miles 43 950
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Thermal Stress and Strain in Microelectronics Packaging (Paperback, Softcover reprint of the original 1st ed. 1993)
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Microelectronics packaging and interconnection have experienced
exciting growth stimulated by the recognition that systems, not
just silicon, provide the solution to evolving applications. In
order to have a high density/
performance/yield/quality/reliability, low cost, and light weight
system, a more precise understanding of the system behavior is
required. Mechanical and thermal phenomena are among the least
understood and most complex of the many phenomena encountered in
microelectronics packaging systems and are found on the critical
path of neatly every design and process in the electronics
industry. The last decade has witnessed an explosive growth in the
research and development efforts devoted to determining the
mechanical and thermal behaviors of microelectronics packaging.
With the advance of very large scale integration technologies,
thousands to tens of thousands of devices can be fabricated on a
silicon chip. At the same time, demands to further reduce packaging
signal delay and increase packaging density between communicat ing
circuits have led to the use of very high power dissipation
single-chip modules and multi-chip modules. The result of these
developments has been a rapid growth in module level heat flux
within the personal, workstation, midrange, mainframe, and super
computers. Thus, thermal (temperature, stress, and strain)
management is vital for microelectronics packaging designs and
analyses. How to determine the temperature distribution in the elec
tronics components and systems is outside the scope of this book,
which focuses on the determination of stress and strain
distributions in the electronics packaging."
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