RF and Time-domain Techniques for Evaluating Novel Semiconductor Transistors (Hardcover, 1st ed. 2022)

This book presents a variety of techniques using high-frequency (RF) and time-domain measurements to understand the electrical performance of novel, modern transistors made of materials such as graphene, carbon nanotubes, and silicon-on-insulator, and using new transistor structures. The author explains how to use conventional RF and time- domain measurements to characterize the performance of the transistors. In addition, he explains how novel transistors may be subject to effects such as self-heating, period-dependent output, non-linearity, susceptibility to short-term degradation, DC-invisible structural defects, and a different response to DC and transient inputs. Readers will understand that in order to fully understand and characterize the behavior of a novel transistor, there is an arsenal of dynamic techniques available. In addition to abstract concepts, the reader will learn of practical tips required to achieve meaningful measurements, and will understand the relationship between these measurements and traditional, conventional DC characteristics.

General

Imprint:	Springer Nature Switzerland AG
Country of origin:	Switzerland
Release date:	December 2021
First published:	2022
Authors:	Keith A. Jenkins
Dimensions:	235 x 155mm (L x W)
Format:	Hardcover
Pages:	168
Edition:	1st ed. 2022
ISBN-13:	978-3-03-077774-6
Categories:	Books > Professional & Technical > Electronics & communications engineering > Electronics engineering > Circuits & components Books > Professional & Technical > Electronics & communications engineering > Electronics engineering > Microwave technology Books > Professional & Technical > Electronics & communications engineering > Electronics engineering > Electronic devices & materials > Semi-conductors & super-conductors
LSN:	3-03-077774-X
Barcode:	9783030777746

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