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Materials Reliability in Microelectronics III: Volume 309 (Paperback) Loot Price: R809
Discovery Miles 8 090
Repayment Terms: R76 pm x 12*
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Materials Reliability in Microelectronics III: Volume 309 (Paperback): Kenneth P. Rodbell, William F. Filter, Harold J. Frost,...

Materials Reliability in Microelectronics III: Volume 309 (Paperback)

Kenneth P. Rodbell, William F. Filter, Harold J. Frost, Paul S. Ho

Series: MRS Proceedings

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Loot Price R809 Discovery Miles 8 090 | Repayment Terms: R76 pm x 12*

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The MRS Symposium Proceeding series is an internationally recognised reference suitable for researchers and practitioners.

General

Imprint: Cambridge UniversityPress
Country of origin: United Kingdom
Series: MRS Proceedings
Release date: June 2014
First published: October 2012
Editors: Kenneth P. Rodbell • William F. Filter • Harold J. Frost • Paul S. Ho
Dimensions: 229 x 152 x 26mm (L x W x T)
Format: Paperback - Trade
Pages: 514
ISBN-13: 978-1-107-40948-4
Categories: Books > Professional & Technical > Mechanical engineering & materials > Materials science > General
LSN: 1-107-40948-9
Barcode: 9781107409484

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