The development of high speed, high frequency circuits and systems
requires an understanding of the properties of materials
functioning at the microwave level. This comprehensive reference
sets out to address this requirement by providing guidance on the
development of suitable measurement methodologies tailored for a
variety of materials and application systems. Bringing together
coverage of a broad range of techniques in one publication for the
first time, this book: Provides a comprehensive introduction to
microwave theory and microwave measurement techniques. Examines
every aspect of microwave material properties, circuit design and
applications. Presents materials property characterisation methods
along with a discussion of the underlying theory. Outlines the
importance of microwave absorbers in the reduction in noise levels
in microwave circuits and their importance within defence industry
applications. Relates each measurement technique to its application
across the fields of microwave engineering, high-speed electronics,
remote sensing and the physical sciences.
This book will appeal to practising engineers and technicians
working in the areas of RF, microwaves, communications, solid-state
devices and radar. Senior students, researchers in microwave
engineering and microelectronics and material scientists will also
find this book a very useful reference.
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