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Nanoscale Characterisation of Ferroelectric Materials - Scanning Probe Microscopy Approach (Hardcover, 2004 ed.) Loot Price: R4,391
Discovery Miles 43 910
Nanoscale Characterisation of Ferroelectric Materials - Scanning Probe Microscopy Approach (Hardcover, 2004 ed.): Marin Alexe,...

Nanoscale Characterisation of Ferroelectric Materials - Scanning Probe Microscopy Approach (Hardcover, 2004 ed.)

Marin Alexe, Alexei Gruverman

Series: NanoScience and Technology

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Loot Price R4,391 Discovery Miles 43 910 | Repayment Terms: R412 pm x 12*

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This book presents recent advances in the field of nanoscale characterization of ferroelectric materials using scanning probe microscopy (SPM). It addresses various imaging mechanisms of ferroelectric domains in SPM, quantitative analysis of the piezoresponse signals as well as basic physics of ferroelectrics at the nanoscale level, such as nanoscale switching, scaling effects, and transport behavior. This state-of-the-art review of theory and experiments on nanoscale polarization phenomena will be a useful reference for advanced readers as well for newcomers and graduate students interested in the SPM techniques. The non-specialists will obtain valuable information about different approaches to electrical characterization by SPM, while researchers in the ferroelectric field will be provided with details of SPM-based measurements of ferroelectrics.

General

Imprint: Springer-Verlag
Country of origin: Germany
Series: NanoScience and Technology
Release date: April 2004
First published: 2004
Editors: Marin Alexe • Alexei Gruverman
Dimensions: 235 x 155 x 18mm (L x W x T)
Format: Hardcover
Pages: 282
Edition: 2004 ed.
ISBN-13: 978-3-540-20662-0
Categories: Books > Professional & Technical > Mechanical engineering & materials > Materials science > General
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LSN: 3-540-20662-0
Barcode: 9783540206620

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