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Debug Automation from Pre-Silicon to Post-Silicon (Hardcover, 2015 ed.)
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Debug Automation from Pre-Silicon to Post-Silicon (Hardcover, 2015 ed.)
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This book describes automated debugging approaches for the bugs and
the faults which appear in different abstraction levels of a
hardware system. The authors employ a transaction-based debug
approach to systems at the transaction-level, asserting the correct
relation of transactions. The automated debug approach for design
bugs finds the potential fault candidates at RTL and gate-level of
a circuit. Debug techniques for logic bugs and synchronization bugs
are demonstrated, enabling readers to localize the most difficult
bugs. Debug automation for electrical faults (delay faults)finds
the potentially failing speedpaths in a circuit at gate-level. The
various debug approaches described achieve high diagnosis accuracy
and reduce the debugging time, shortening the IC development cycle
and increasing the productivity of designers. Describes a unified
framework for debug automation used at both pre-silicon and
post-silicon stages; Provides approaches for debug automation of a
hardware system at different levels of abstraction, i.e., chip,
gate-level, RTL and transaction level; Includes techniques for
debug automation of design bugs and electrical faults, as well as
an infrastructure to debug NoC-based multiprocessor SoCs.
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