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Books > Computing & IT > General theory of computing
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New Methods of Concurrent Checking (Hardcover, 2008 ed.)
Loot Price: R2,750
Discovery Miles 27 500
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New Methods of Concurrent Checking (Hardcover, 2008 ed.)
Series: Frontiers in Electronic Testing, 42
Expected to ship within 18 - 22 working days
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Computers are everywhere around us. We, for example, as air
passengers, car drivers, laptop users with Internet connection,
cell phone owners, hospital patients, inhabitants in the vicinity
of a nuclear power station, students in a digital library or
customers in a supermarket are dependent on their correct
operation. Computers are incredibly fast, inexpensive and equipped
with almost unimag- able large storage capacity. Up to 100 million
transistors per chip are quite common today - a single transistor
for each citizen of a large capital city in the world can be 2
easily accommodated on an ordinary chip. The size of such a chip is
less than 1 cm . This is a fantastic achievement for an
unbelievably low price. However, the very small and rapidly
decreasing dimensions of the transistors and their connections over
the years are also the reason for growing problems with reliability
that will dramatically increase for the nano-technologies in the
near future. Can we always trust computers? Are computers always
reliable? Are chips suf- ciently tested with respect to all
possible permanent faults if we buy them at a low price or have
errors due to undetected permanent faults to be discovered by c-
current checking? Besides permanent faults, many temporary or
transient faults are also to be expected.
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