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Test and Diagnosis for Small-Delay Defects (Hardcover, 2012 ed.) Loot Price: R2,801
Discovery Miles 28 010
Repayment Terms: R262 pm x 12*
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Test and Diagnosis for Small-Delay Defects (Hardcover, 2012 ed.): Mohammad Tehranipoor, Ke Peng, Krishnendu Chakrabarty

Test and Diagnosis for Small-Delay Defects (Hardcover, 2012 ed.)

Mohammad Tehranipoor, Ke Peng, Krishnendu Chakrabarty

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Loot Price R2,801 Discovery Miles 28 010 | Repayment Terms: R262 pm x 12*

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This book will introduce new techniques for detecting and diagnosing small-delay defects in integrated circuits. Although this sort of timing defect is commonly found in integrated circuits manufactured with nanometer technology, this will be the first book to introduce effective and scalable methodologies for screening and diagnosing small-delay defects, including important parameters such as process variations, crosstalk, and power supply noise.

General

Imprint: Springer-Verlag New York
Country of origin: United States
Release date: September 2011
First published: 2012
Authors: Mohammad Tehranipoor • Ke Peng • Krishnendu Chakrabarty
Dimensions: 235 x 155 x 14mm (L x W x T)
Format: Hardcover
Pages: 212
Edition: 2012 ed.
ISBN-13: 978-1-4419-8296-4
Categories: Books > Professional & Technical > Electronics & communications engineering > Electronics engineering > Circuits & components
LSN: 1-4419-8296-5
Barcode: 9781441982964

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