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Books > Professional & Technical > Mechanical engineering & materials > Materials science > Testing of materials

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Lock-in Thermography - Basics and Use for Evaluating Electronic Devices and Materials (Hardcover, 3rd ed. 2018) Loot Price: R4,594

Discovery Miles 45 940

Repayment Terms: R431 pm x 12*

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Lock-in Thermography - Basics and Use for Evaluating Electronic Devices and Materials (Hardcover, 3rd ed. 2018): Otwin...

Lock-in Thermography - Basics and Use for Evaluating Electronic Devices and Materials (Hardcover, 3rd ed. 2018)

Otwin Breitenstein, Wilhelm Warta, Martin C. Schubert

Series: Springer Series in Advanced Microelectronics, 10

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Loot Price R4,594 Discovery Miles 45 940 | Repayment Terms: R431 pm x 12*

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This is the first book on lock-in thermography, an analytical method applied to the diagnosis of microelectronic devices. This useful introduction and guide reviews various experimental approaches to lock-in thermography, with special emphasis on the lock-in IR thermography developed by the authors themselves.

General

Imprint:	Springer International Publishing AG
Country of origin:	Switzerland
Series:	Springer Series in Advanced Microelectronics, 10
Release date:	2019
First published:	2018
Authors:	Otwin Breitenstein • Wilhelm Warta • Martin C. Schubert
Dimensions:	235 x 155mm (L x W)
Format:	Hardcover
Pages:	321
Edition:	3rd ed. 2018
ISBN-13:	978-3-319-99824-4
Categories:	Books > Professional & Technical > Electronics & communications engineering > Electronics engineering > General Books > Professional & Technical > Mechanical engineering & materials > Materials science > Testing of materials > General Promotions
LSN:	3-319-99824-2
Barcode:	9783319998244