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Books > Professional & Technical > Mechanical engineering & materials > Materials science > Testing of materials

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Lock-in Thermography - Basics and Use for Evaluating Electronic Devices and Materials (Hardcover, 3rd ed. 2018) Loot Price: R4,002
Discovery Miles 40 020
Lock-in Thermography - Basics and Use for Evaluating Electronic Devices and Materials (Hardcover, 3rd ed. 2018): Otwin...

Lock-in Thermography - Basics and Use for Evaluating Electronic Devices and Materials (Hardcover, 3rd ed. 2018)

Otwin Breitenstein, Wilhelm Warta, Martin C. Schubert

Series: Springer Series in Advanced Microelectronics, 10

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Loot Price R4,002 Discovery Miles 40 020 | Repayment Terms: R375 pm x 12*

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This is the first book on lock-in thermography, an analytical method applied to the diagnosis of microelectronic devices. This useful introduction and guide reviews various experimental approaches to lock-in thermography, with special emphasis on the lock-in IR thermography developed by the authors themselves.

General

Imprint: Springer International Publishing AG
Country of origin: Switzerland
Series: Springer Series in Advanced Microelectronics, 10
Release date: 2019
First published: 2018
Authors: Otwin Breitenstein • Wilhelm Warta • Martin C. Schubert
Dimensions: 235 x 155mm (L x W)
Format: Hardcover
Pages: 321
Edition: 3rd ed. 2018
ISBN-13: 978-3-319-99824-4
Categories: Books > Professional & Technical > Electronics & communications engineering > Electronics engineering > General
Books > Professional & Technical > Mechanical engineering & materials > Materials science > Testing of materials > General
LSN: 3-319-99824-2
Barcode: 9783319998244

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