0
Your cart

Your cart is empty

Books > Professional & Technical > Mechanical engineering & materials > Materials science

Buy Now

Materials, Processes, Integration and Reliability in Advanced Interconnects for Micro- and Nanoelectronics: Volume 990 - Symposium Held April 10-12, 2007, San Francisco, California, U.S.A. (Paperback) Loot Price: R845
Discovery Miles 8 450
Materials, Processes, Integration and Reliability in Advanced Interconnects for Micro- and Nanoelectronics: Volume 990 -...

Materials, Processes, Integration and Reliability in Advanced Interconnects for Micro- and Nanoelectronics: Volume 990 - Symposium Held April 10-12, 2007, San Francisco, California, U.S.A. (Paperback)

Qinghuang Lin, E. Todd Ryan, Wen-li Wu, Do Yeung Yoon

Series: MRS Proceedings

 (sign in to rate)
Loot Price R845 Discovery Miles 8 450 | Repayment Terms: R79 pm x 12*

Bookmark and Share

Expected to ship within 10 - 15 working days

In 2004, the microelectronics industry quietly ushered in the Nanoelectronics Era with the mass production of sub-100nm node devices. The current leading-edge semiconductor chips in mass production - the so-called 90nm node devices - have a transistor gate length of less than 50nm. This rapid technological advancement in the semiconductor industry has been made possible by innovations in materials employed in both transistor fabrication (front-end-of-the-line, FEOL) and interconnect fabrication (back-end-of-the-line, BEOL). The 90nm node BEOL features copper (Cu) interconnects and dielectric materials with a low-dielectric constant (k) of about 3.0. However, for the next generations of 65nm node and beyond, evolutionary and revolutionary innovations in BEOL materials and processes are needed to fuel the continued, healthy growth of the semiconductor. This book provides a forum to exchange the latest advances in materials, processes, integration, and reliability in advanced interconnects and packaging. The book also addressed interconnects for emerging technologies, including 3D chip stacking and optical interconnects, as well as interconnects for optoelectronics, plastic electronics and molecular electronics.

General

Imprint: Cambridge UniversityPress
Country of origin: United Kingdom
Series: MRS Proceedings
Release date: June 2014
First published: July 2012
Editors: Qinghuang Lin • E. Todd Ryan • Wen-li Wu • Do Yeung Yoon
Dimensions: 229 x 152 x 19mm (L x W x T)
Format: Paperback - Trade
Pages: 358
ISBN-13: 978-1-107-40871-5
Categories: Books > Professional & Technical > Mechanical engineering & materials > Materials science > General
Promotions
LSN: 1-107-40871-7
Barcode: 9781107408715

Is the information for this product incomplete, wrong or inappropriate? Let us know about it.

Does this product have an incorrect or missing image? Send us a new image.

Is this product missing categories? Add more categories.

Review This Product

No reviews yet - be the first to create one!

You might also like..

Mechanics Of Materials - SI Edition
Barry Goodno, James Gere Paperback R1,376 R1,283 Discovery Miles 12 830
Advances in Structural Adhesive Bonding
D. Dillard Paperback R6,793 Discovery Miles 67 930
Nanofluid Applications for Advanced…
Shriram S. Sonawane, Mohsen Sharifpur Paperback R3,922 Discovery Miles 39 220
Encyclopedia of Nanomaterials
Younan Xia, Yadong Yin Hardcover R56,960 Discovery Miles 569 600
Comprehensive Structural Integrity
Ferri M.H. Aliabadi, Winston (Wole) Soboyejo Hardcover R99,774 Discovery Miles 997 740
Microfluidics - Modeling, Mechanics and…
Bastian E. Rapp Paperback R6,385 Discovery Miles 63 850
Handbook of Thermoset Plastics
Hanna Dodiuk Paperback R5,942 Discovery Miles 59 420
Encyclopedia of Smart Materials
Abdul Ghani Olabi Hardcover R70,960 Discovery Miles 709 600
Encyclopedia of Materials: Composites
Dermot Brabazon Hardcover R53,404 Discovery Miles 534 040
CRISPR and RNAi Systems…
Kamel A. Abd-Elsalam, Ki-Taek Lim Paperback R5,005 Discovery Miles 50 050
Surface Metrology for Micro- and…
Wei Gao Paperback R4,387 Discovery Miles 43 870
Comprehensive Nuclear Materials
Rudy Konings, Roger Stoller Hardcover R78,910 Discovery Miles 789 100

See more

Partners