Nondestructive Characterization of Materials X (Hardcover)

The papers published in these peer-reviewed proceedings represent the latest developments in nondestructive characterization of materials and were presented at the Tenth International Symposium on Nondestructive Characterization of Materials held on June 26 - 30, 2000 in Karuizawa, Japan. The symposium was held concurrently with three other symposia and one workshop. This symposium is the tenth in the series that began in 1983 and became an international meeting in 1986.
The symposium started with a Plenary Lecture entitled 'Application of Non-contact Ultrasonics to Nondestrctive Characterization of Materials' by Professor R.E. Green, Jr. Various characterization methods were presented at the symposium, including ultrasonics, X-ray, eddy currents, laser, thermal wave, acoustic emission, optical fibers, optics, magnetics and ultrasonic microscope. Thin films and coatings as well as smart materials were also emphasized in this symposium.

General

Imprint:	Elsevier Science Ltd
Country of origin:	United Kingdom
Release date:	March 2001
Authors:	R.E. Green • N. Takeda • B. B. Djordjevic • T. Saito • T. Kishi
Dimensions:	234 x 156 x 19mm (L x W x T)
Format:	Hardcover
Pages:	436
ISBN-13:	978-0-08-043799-6
Categories:	Books > Professional & Technical > Mechanical engineering & materials > Materials science > General Promotions
LSN:	0-08-043799-0
Barcode:	9780080437996

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