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Speckle Metrology (Hardcover)
Loot Price: R10,632
Discovery Miles 106 320
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Speckle Metrology (Hardcover)
Series: Optical Science and Engineering
Expected to ship within 12 - 17 working days
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Donate to Against Period Poverty
Total price: R10,642
Discovery Miles: 106 420
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This practical reference offers state-of-the-art coverage of
speckle metrology and its value as a measuring technique in
industry.;Examing every important aspect of the field, Speckle
Metrology: surveys the origin of speckle displacement and
decorrelation; presents procedures for deformation analysis and
shape measurement of rough objects; explains particle image
velocimetry (PIV), the processing of PIV records, and the design
requirements of PIV equipment; discusses the applications of white
light speckle methods and the production of artificial speckles;
describes the measurement of surface roughness with laser speckles
and polychromatic speckles; illustrates semiautomatic and automatic
methods for the analysis of Young's fringes; calculates the
variation of Young's fringes with the change in the microrelief of
the rough surface; and explicates hololenses for imaging and
provides design details with aberration corrections for hololense
systems.;With over 1500 literature citations, tables, figures and
display equations, Speckle Metrology is a resource for students and
professionals in the fields of optical, mechanical, electrical and
electronics engineering; applied physics; and stress analysis.
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