Optical Methods of Measurement: Wholefield Techniques, Second
Edition provides a comprehensive collection of wholefield optical
measurement techniques for engineering applications. Along with the
reorganization of contents, this edition includes a new chapter on
optical interference, new material on nondiffracting and singular
beams and their applications, and updated bibliography and
additional reading sections. The book explores the propagation of
laser beams, metrological applications of phase-singular beams,
various detectors such as CCD and CMOS devices, and recording
materials. It also covers interference, diffraction, and digital
fringe pattern measurement techniques, with special emphasis on
phase measurement interferometry and algorithms. The remainder of
the book focuses on theory, experimental arrangements, and
applications of wholefield techniques. The author discusses digital
hologram interferometry, digital speckle photography, digital
speckle pattern interferometry, Talbot interferometry, and
holophotoelasticity. This updated book compiles the major
wholefield methods of measurement in one volume. It provides a
solid understanding of the techniques by describing the physics
behind them. In addition, the examples given illustrate how the
techniques solve measurement problems.
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