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Thermophysical Properties and Measuring Technique of Ge-Sb-Te Alloys for Phase Change Memory (Hardcover, 1st ed. 2020) Loot Price: R2,927
Discovery Miles 29 270
Repayment Terms: R274 pm x 12*
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Thermophysical Properties and Measuring Technique of Ge-Sb-Te Alloys for Phase Change Memory (Hardcover, 1st ed. 2020): Rui Lan

Thermophysical Properties and Measuring Technique of Ge-Sb-Te Alloys for Phase Change Memory (Hardcover, 1st ed. 2020)

Rui Lan

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Loot Price R2,927 Discovery Miles 29 270 | Repayment Terms: R274 pm x 12*

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This book focuses on the thermophysical properties of Ge-Sb-Te alloys, which are the most widely used phase change materials, and the technique for measuring them. Describing the measuring procedure and parameter calibration in detail, it provides readers with an accurate method for determining the thermophysical properties of phase change materials and other related materials. Further, it discusses combining thermal and electrical conductivity data to analyze the conduction mechanism, allowing readers to gain an understanding of phase change materials and PCM industry simulation.

General

Imprint: Springer Verlag, Singapore
Country of origin: Singapore
Release date: 2020
First published: 2020
Authors: Rui Lan
Dimensions: 235 x 155mm (L x W)
Format: Hardcover
Pages: 139
Edition: 1st ed. 2020
ISBN-13: 978-981-15-2216-1
Categories: Books > Science & Mathematics > Physics > States of matter > Condensed matter physics (liquids & solids)
Books > Professional & Technical > Electronics & communications engineering > Electronics engineering > Circuits & components
Books > Professional & Technical > Mechanical engineering & materials > Materials science > Testing of materials > General
Books > Professional & Technical > Electronics & communications engineering > Electronics engineering > Electronic devices & materials > Semi-conductors & super-conductors
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LSN: 981-15-2216-2
Barcode: 9789811522161

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