Design for Testability, Debug and Reliability - Next Generation Measures Using Formal Techniques (Hardcover, 1st ed. 2021)

This book introduces several novel approaches to pave the way for the next generation of integrated circuits, which can be successfully and reliably integrated, even in safety-critical applications. The authors describe new measures to address the rising challenges in the field of design for testability, debug, and reliability, as strictly required for state-of-the-art circuit designs. In particular, this book combines formal techniques, such as the Satisfiability (SAT) problem and the Bounded Model Checking (BMC), to address the arising challenges concerning the increase in test data volume, as well as test application time and the required reliability. All methods are discussed in detail and evaluated extensively, while considering industry-relevant benchmark candidates. All measures have been integrated into a common framework, which implements standardized software/hardware interfaces.

General

Imprint:	Springer Nature Switzerland AG
Country of origin:	Switzerland
Release date:	April 2021
First published:	2021
Authors:	Sebastian Huhn • Rolf Drechsler
Dimensions:	235 x 155mm (L x W)
Format:	Hardcover
Pages:	164
Edition:	1st ed. 2021
ISBN-13:	978-3-03-069208-7
Categories:	Books > Professional & Technical > Electronics & communications engineering > Electronics engineering > Circuits & components Books > Computing & IT > Computer hardware & operating systems > Computer architecture & logic design > General Promotions
LSN:	3-03-069208-6
Barcode:	9783030692087

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